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54C164245 Datasheet(PDF) 16 Page - STMicroelectronics |
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54C164245 Datasheet(HTML) 16 Page - STMicroelectronics |
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16 / 23 page ![]() Test circuit 54AC164245 16/23 DocID18093 Rev 4 5 Test circuit Figure 3. Test circuit 1. CL = 50 pF or equivalent (includes jig and probe capacitance), RT = ZOUT of pulse generator (typically 50 Ω ), VREF = 0.5 VDD. ISRC is set to -1.0 mA and ISNK is set to 1.0 mA for tPHL and tPLH measurements. Input signal from pulse generator: VI = 0.0 V to VDD; f = 10 MHz; tr = 1.0 V/ns "0.3 V/ns; tf = 1.0 V/ns "0.3 V/ns; tr and tf are measured from 0.1 VDD to 0.9 VDD and from 0.9 VDD to 0.1 VDD respectively. Figure 4. Waveform 1: propagation delay |
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