ST72325AR7-Auto datasheet(204/243 Pages) STMICROELECTRONICS

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ST72325xxx-Auto

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19.7.2

EMI (electromagnetic interference)

Based on a simple application running on the product (toggling two LEDs through the I/O

ports), the product is monitored in terms of emission. This emission test is in line with the

norm SAE J 1752/3 which specifies the board and the loading of each pin.

19.7.3

Absolute maximum ratings (electrical sensitivity)

Based on three different tests (ESD, LU and DLU) using specific measurement methods, the

product is stressed in order to determine its performance in terms of electrical sensitivity.

For more details, refer to the application note AN1181.

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models

can be simulated: Human Body Model and Machine Model. This test conforms to the

JESD22-A114A/A115A standard.

Table 124.

EMS test results

Symbol

Parameter

Conditions

Level/Class

VFESD

Voltage limits to be applied on any I/O pin to

induce a functional disturbance

VDD =5V, TA = +25°C, fOSC =8 MHz,

conforms to IEC 1000-4-2

VFFTB

Fast transient voltage burst limits to be applied

through 100pF on VDD and VDD pins to induce a

functional disturbance

LQFP44:

VDD =5V, TA = +25°C, fOSC = 8 MHz,

conforms to IEC 1000-4-4

Table 125.

EMI emissions

Symbol Parameter

Conditions

Monitored

frequency band

Max vs [fOSC/fCPU]

(1)

Unit

VDD  5V, TA  +25°C,

conforming to SAE J 1752/3

8/4 MHz

16/8 MHz

SEMI

Peak level

48/60 Kbyte Flash devices in

LQFP44 and LQFP64 packages

and

32 Kbyte Flash devices in

LQFP64 package

0.1 MHz to 30 MHz

dBµV

30 MHz to 130 MHz

130MHz to 1GHz

SAE EMI Level

2.5

SEMI

Peak level

16/32 Kbyte Flash devices in

LQFP32 and LQFP44 packages

0.1 MHz to 30 MHz

dBµV

30 MHz to 130 MHz

130MHz to 1GHz

SAE EMI Level

3.5

Data based on characterization results, not tested in production.

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