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LTC2430IGN Datasheet(PDF) 19 Page - Linear Technology |
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LTC2430IGN Datasheet(HTML) 19 Page - Linear Technology |
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19 / 40 page ![]() LTC2430/LTC2431 19 24301f The serial data output pin (SDO) is Hi-Z as long as CS is HIGH. At any time during the conversion cycle, CS may be pulled LOW in order to monitor the state of the converter. Once CS is pulled LOW, SCK goes LOW and EOC is output to the SDO pin. EOC = 1 while a conversion is in progress and EOC = 0 if the device is in the sleep state. When testing EOC, if the conversion is complete (EOC = 0), the device will exit the sleep state and enter the data output state if CS remains LOW. In order to allow the device to return to the low power sleep state, CS must be pulled HIGH before the first rising edge of SCK. In the internal SCK timing mode, SCK goes HIGH and the device begins outputting data at time tEOCtest after the falling edge of CS (if EOC = 0) or tEOCtest after EOC goes LOW (if CS is LOW during the falling edge of EOC). The value of tEOCtest is 23µs if the device is using its internal oscillator (FO = logic LOW or HIGH). If FO is driven by an external oscillator of frequency fEOSC, then tEOCtest is 3.6/fEOSC. If CS is pulled HIGH before time tEOCtest, the device returns to the sleep state. The conversion result is held in the internal static shift register. If CS remains LOW longer than tEOCtest, the first rising edge of SCK will occur and the conversion result is serially shifted out of the SDO pin. The data output cycle begins on this first rising edge of SCK and concludes after the 24th rising edge. Data is shifted out the SDO pin on each falling edge of SCK. The internally generated serial clock is output to the SCK pin. This signal may be used to shift the conversion result into external circuitry. EOC can be latched on the first rising edge of SCK and the last bit of the conversion result on the 24th rising edge of SCK. After the 24th rising edge, SDO goes HIGH (EOC = 1), SCK stays HIGH and a new conversion starts. Typically, CS remains LOW during the data output state. However, the data output state may be aborted by pulling CS HIGH anytime between the first and 24th rising edge of SCK, see Figure 9. On the rising edge of CS, the device aborts the data output state and immediately initiates a new conversion. This is useful for systems not requiring all 24 bits of output data, aborting an invalid conversion cycle, or synchronizing the start of a conversion. If CS is pulled HIGH while the converter is driving SCK LOW, the Figure 9. Internal Serial Clock, Reduced Data Output Length APPLICATIO S I FOR ATIO SDO SCK (INTERNAL) CS >tEOCtest MSB SIG BIT 8 TEST EOC BIT 19 BIT 18 BIT 20 BIT 21 BIT 22 EOC BIT 23 EOC BIT 0 SLEEP TEST EOC (OPTIONAL) SLEEP DATA OUTPUT Hi-Z Hi-Z Hi-Z Hi-Z Hi-Z DATA OUTPUT CONVERSION CONVERSION SLEEP 2431 F09 <tEOCtest VCC 10k TEST EOC VCC FO REF+ REF– SCK IN+ IN– SDO GND CS REFERENCE VOLTAGE 0.1V TO VCC ANALOG INPUT RANGE –0.5VREF TO 0.5VREF 3-WIRE SPI INTERFACE 1 µF 2.7V TO 5.5V LTC2430/ LTC2431 = 50Hz REJECTION = EXTERNAL OSCILLATOR = 60Hz REJECTION VCC |
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