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AM41PDS3228DB10IS Datasheet(PDF) 37 Page - Advanced Micro Devices |
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AM41PDS3228DB10IS Datasheet(HTML) 37 Page - Advanced Micro Devices |
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37 / 59 page ![]() 36 Am41PDS3228D May 13, 2002 P R E L IMINARY TEST CONDITIONS Table 12. Test Specifications KEY TO SWITCHING WAVEFORMS 2.7 k Ω CL 6.2 k Ω 3.3 V Device Under Test Note: Diodes are IN3064 or equivalent Figure 12. Test Setup Test Condition 100, 110 ns Unit Output Load 1 TTL gate Output Load Capacitance, C L (including jig capacitance) 30 pF Input Rise and Fall Times 5 ns Input Pulse Levels 2.0 V Input timing measurement reference levels 1.0 V Output timing measurement reference levels 1.0 V WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 2.0 V 0.0 V 1.0 V 1.0 V Output Measurement Level Input Figure 13. Input Waveforms and Measurement Levels |
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