IMXRT1160AXEC datasheet(82/130 Pages) NXP

82 / 130 page

i.MX RT1160 Crossover Processors Data Sheet for Extended Industrial Products, Rev. 4, 06/2025

NXP Semiconductors

Electrical characteristics

The following figure shows a plot of the ADC sample time versus RAS.

Figure 35. Sample time VS. RAS

4.8.1.1

12-bit ADC input impedance equivalent circuit diagram

There is an additional RIOMUX of 350  (from 295 to 405 ) resistance if an input goes through the MUX

inside the IO and CP of 2.5 pF as shown in Figure 36.

To calculate the sample request time, using the following equation where RADCtotal = RADIN + RIOMUX,

RIOMUX = 350 , CP = 2.5 pF and B = 11 for 1/4 LSB settling.

Tsmp_req = B [RAS (CAS + CP + CADIN) + (RAS + RADCtotal) CADIN]

4 See Figure 35, "Sample time VS. RAS".

5 1 LSB = (VREFH - VREFL) / 2^N, N = 12

6 ADC conversion clock at max frequency and using linear histogram.

7 No missing code

8 Input data used for test is 1 kHz sine wave.

9 Measured at VREFH = 1.0 V and pwrsel = 2.

10 ENOB can be lower than shown, if an ADC channel corrupts other ADC channels through capacitive coupling. This coupling

may be dominated by board parasitics. Care must be taken not to corrupt the desired channel being measured. This coupling

becomes worse at higher analog frequencies and with switching waveforms due to the harmonic content.

11 Gain error is FSE-ZSE (same as FSE-EO).

12 Error measured at full scale at 1.0 V.

13 Offset error is same as ZSE, error measured at 0 V with zero scale.

IMXRT1160AXEC Datasheet(PDF) 82 Page - NXP Semiconductors