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R5F5651EDDFM Datasheet(PDF) 164 Page - Renesas Technology Corp |
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R5F5651EDDFM Datasheet(HTML) 164 Page - Renesas Technology Corp |
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164 / 188 page ![]() R01DS0276EJ0240 Rev.2.40 Page 164 of 188 Oct 31, 2023 RX65N Group, RX651 Group 2. Electrical Characteristics Note: The above specification values apply when there is no access to the external bus during A/D conversion. If access proceeds during A/D conversion, values may not fall within the above ranges. Note 1. The conversion time includes the sampling time and the comparison time. As the test conditions, the number of sampling states is indicated. Note 2. The value in parentheses indicates the sampling time. Table 2.50 12-Bit A/D (Unit 1) Conversion Characteristics Conditions: VCC = AVCC0 = AVCC1 = VCC_USB = VBATT = 2.7 to 3.6 V, 2.7 V ≤ VREFH0 ≤ AVCC0, VSS = AVSS0 = AVSS1 = VREFL0 = VSS_USB = 0 V, PCLKB = PCLKD = 1 MHz to 60 MHz, Ta = Topr, Source impedance = 1.0 kΩ Item Min. Typ. Max. Unit Test Conditions Resolution 8 — 12 Bit Conversion time*1 (Operation at PCLKD = 60 MHz) 0.88 (0.633)*2 — — µs Sampling in 38 states (ADSAM.SAM = 1) Conversion time*1 (Operation at PCLKD = 30 MHz) 1 (0.500)*2 — — µs Sampling in 15 states (ADSAM.SAM = 1) Analog input capacitance — — 30 pF Offset error — ±2.0 ±3.5 LSB Full-scale error — ±2.0 ±3.5 LSB Quantization error — ±0.5 — LSB Absolute accuracy — ±4.0 ±6.0 LSB DNL differential nonlinearity error (Operation at PCLKD = 60 MHz) — ±1.5 ±4.0 LSB DNL differential nonlinearity error (Operation at PCLKD = 30 MHz) — ±1.5 ±2.5 LSB INL integral nonlinearity error (Operation at PCLKD = 60 MHz) — ±2.0 ±4.0 LSB INL integral nonlinearity error (Operation at PCLKD = 30 MHz) — ±2.0 ±3.5 LSB Table 2.51 A/D Internal Reference Voltage Characteristics Conditions: VCC = AVCC0 = AVCC1 = VCC_USB = VBATT = 2.7 to 3.6 V, 2.7 V ≤ VREFH0 ≤ AVCC0, VSS = AVSS0 = AVSS1 = VREFL0 = VSS_USB = 0 V, PCLKB = PCLKD = 60 MHz, Ta = Topr Item Min. Typ. Max. Unit Test Conditions A/D internal reference voltage 1.13 1.18 1.23 V |
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