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MPC5673F Datasheet(PDF) 25 Page - Freescale Semiconductor, Inc

Part # MPC5673F
Description  MPC5674F Microcontroller Data Sheet
PDF  132 Pages
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Manufacturer  FREESCALE [Freescale Semiconductor, Inc]
Direct Link  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

MPC5673F Datasheet(HTML) 25 Page - Freescale Semiconductor, Inc

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Electrical Characteristics
MPC5674F Microcontroller Data Sheet, Rev. 6
Freescale Semiconductor
25
VRE_TEM
Radiated emissions,
electric field and
magnetic field
VDD = 1.2 V
VDDE = 3.3 V
VDDEH = 5 V
TA = 25 °C
416 BGA
EBI off
CLK off
FM on4
40 MHz crystal
264 MHz
(fEBI_CAL =66
MHz)
0.15–50
24
dB
μV
1
50–150
25
150–500
25
500–1000
21
IEC and SAE level
K5
1,3
1 Determined according to IEC Standard 61967-2, Measurement of Radiated Emissions—TEM Cell and Wideband TEM
Cell Method, and SAE Standard J1752-3, Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband
TEM (GTEM) Cell Method.
2 I = 36 dB
μV
3 Specified according to Annex D of IEC Standard 61967-2, Measurement of Radiated Emissions—TEM Cell and Wideband
TEM Cell Method, and Appendix D of SAE Standard J1752-3, Measurement of Radiated Emissions from Integrated
Circuits—TEM/Wideband TEM (GTEM) Cell Method.
4 “FM on” = FM depth of ±2%
5 K = 30 dB
μV
Table 8. EMC Radiated Emissions Operating Behaviors: 516 BGA
Symbol
Description
Conditions
fOSC
fSYS
Frequency
band (MHz)
Level
(max.)
Unit Notes
VRE_TEM
Radiated emissions,
electric field and
magnetic field
VDD = 1.2 V
VDDE = 3.3 V
VDDEH = 5 V
TA = 25 °C
516 BGA
EBI on
CLK on
FM off
40 MHz crystal
264 MHz
(fEBI_CAL =66
MHz)
0.15–50
40
dB
μV
1
1 Determined according to IEC Standard 61967-2, Measurement of Radiated Emissions—TEM Cell and Wideband TEM
Cell Method, and SAE Standard J1752-3, Measurement of Radiated Emissions from Integrated Circuits—TEM/Wideband
TEM (GTEM) Cell Method.
50–150
48
150–500
48
500–1000
47
IEC and SAE level
G2
2 G = 48 dB
μV
1, 3
3 Specified according to Annex D of IEC Standard 61967-2, Measurement of Radiated Emissions—TEM Cell and Wideband
TEM Cell Method, and Appendix D of SAE Standard J1752-3, Measurement of Radiated Emissions from Integrated
Circuits—TEM/Wideband TEM (GTEM) Cell Method.
VRE_TEM
Radiated emissions,
electric field and
magnetic field
VDD = 1.2 V
VDDE = 3.3 V
VDDEH = 5 V
TA = 25 °C
516 BGA
EBI on
CLK on
FM on4
4 “FM on” = FM depth of ±2%
40 MHz crystal
264 MHz
(fEBI_CAL =66
MHz)
0.15–50
40
dB
μV
1
50–150
44
150–500
41
500–1000
36
IEC and SAE level
G2
1, 3
Table 7. EMC Radiated Emissions Operating Behaviors: 416 BGA (continued)
Symbol
Description
Conditions
fOSC
fSYS
Frequency
band (MHz)
Level
(max.)
Unit Notes



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