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STM8L151C8T6 Datasheet(PDF) 20 Page - STMicroelectronics |
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STM8L151C8T6 Datasheet(HTML) 20 Page - STMicroelectronics |
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20 / 129 page ![]() Functional overview STM8L15xx8, STM8L15xR6 20/129 Doc ID 17943 Rev 5 3.9 Analog-to-digital converter ● 12-bit analog-to-digital converter (ADC1) with 28 channels (including 4 fast channel), temperature sensor and internal reference voltage ● Conversion time down to 1 µs with fSYSCLK= 16 MHz ● Programmable resolution ● Programmable sampling time ● Single and continuous mode of conversion ● Scan capability: automatic conversion performed on a selected group of analog inputs ● Analog watchdog: interrupt generation when the converted voltage is outside the programmed threshold ● Triggered by timer Note: ADC1 can be served by DMA1. 3.10 Digital-to-analog converter ● 12-bit DAC with 2 buffered outputs (two digital signals can be converted into two analog voltage signal outputs) ● Synchronized update capability using timers ● DMA capability for each channel ● External triggers for conversion ● Noise-wave generation ● Triangular-wave generation ● Dual DAC channels with independent or simultaneous conversions ● Input reference voltage VREF+ for better resolution Note: DAC can be served by DMA1. 3.11 Ultralow power comparators The high density and medium+ density STM8L15xx devices embed two comparators (COMP1 and COMP2) sharing the same current bias and voltage reference. The voltage reference can be internal or external (coming from an I/O). ● One comparator with fixed threshold (COMP1). ● One comparator rail to rail with fast or slow mode (COMP2). The threshold can be one of the following: – DAC output – External I/O – Internal reference voltage or internal reference voltage submultiple (1/4, 1/2, 3/4) The two comparators can be used together to offer a window function. They can wake up from Halt mode. |
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