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LM3560TLX/NOPB Datasheet(PDF) 5 Page - Texas Instruments

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Part # LM3560TLX/NOPB
Description  Synchronous Boost Flash Driver
PDF  48 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

LM3560TLX/NOPB Datasheet(HTML) 5 Page - Texas Instruments

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LM3560
www.ti.com
SNOSB43B – SEPTEMBER 2011 – REVISED AUGUST 2013
ELECTRICAL CHARACTERISTICS
(1) (2) (continued)
Limits in standard typeface are for TA = +25°C. Limits in boldface type apply over the full operating ambient temperature
range (
−40°C ≤ TA ≤ +85°C). Unless otherwise specified, VIN = 3.6V, VHWEN = VIN.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
Time from when
ADC Delay Register Bit [5] = 1
16
ILED hits target until
tD
µs
ADC Delay Register Bit [5] = 0
VLED data is
250
ADC Delay Register Bits [4:0] = 0000
available
VF_ADC
ADC Threshold
3.0V
≤ VIN ≤ 4.2V, VLED Monitor Register Bits [3:0] = 1111
4.05
4.2
4.35
V
HWEN, STROBE, TX1/TORCH/GPIO1, TX2/INT/GPIO2 Voltage Specifications
VIL
Input Logic Low
2.7V
≤ VIN ≤ 4.2V
0
0.4
V
VIH
Input Logic High
2.7V
≤ VIN ≤ 4.2V
1.2
VIN
V
Internal Pull Down
RPD
Resistance on TX1,
300
k
Ω
TX2, STROBE
I2C-Compatible Voltage Specifications (SCL, SDA)
VIL
Input Logic Low
2.7V
≤ VIN ≤ 4.2V
0
0.4
V
VIH
Input Logic High
2.7V
≤ VIN ≤ 4.2V
1.2
VIN
V
Output Logic Low
VOL
ILOAD = 3mA, 2.7V ≤ VIN ≤ 4.2V
400
mV
(SDA)
I2C-Compatible Timing Specifications (SCL, SDA) (7), see Figure 42
SCL(Clock
fSCL
0
400
kHz
Frequency)
20ns +
Rise Time of Both
tRISE
0.1 ×
300
ns
SDA and SCL
CBUS
20ns +
Fall Time of Both
tFALL
0.1 ×
300
ns
SDA and SCL
CBUS
Low Period of SCL
tLOW
1.3
µs
Clock
High Period of SCL
tHIGH
600
ns
Clock
Hold Time for Start
tHD;STA
(or Repeated
600
ns
Start)Condition
Set-up Time for a
tSU;STA
600
ns
Repeated Start
tHD;DAT
Data Hold Time
0
ns
tSU;DAT
Data Setup Time
100
ns
Set-up Time for
tSU;STO
600
ns
Stop Condition
tVD;DAT
Data Valid Time
900
ns
Data Valid
tVD;ACK
900
ns
Acknowledge Time
Bus Free Time
Between a Start
tBUF
1.3
µs
and a Stop
Condition
(7)
Specified by design. Not production tested.
Copyright © 2011–2013, Texas Instruments Incorporated
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