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ST10F296 Datasheet(PDF) 318 Page - STMicroelectronics |
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ST10F296 Datasheet(HTML) 318 Page - STMicroelectronics |
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318 / 346 page ![]() Obsolete Product(s) - Obsolete Product(s) Electrical characteristics ST10F296E 318/346 The jitter in the PLL loop can be modeled as being dominated by the i1/f2 noise for N smaller than a ‘certain’ value that depends on the PLL output frequency and on the bandwidth characteristics of the program loop. Above this ‘certain’ value, the jitter becomes dominated by the i1/f3 noise component. For N greater than a second value of N, the jitter does not increase with a longer time interval due to an apparent saturation effect (the jitter is stable, thereby increasing the number of clock periods, N). The PLL loop acts as a high pass filter for any noise in the loop, with a cutoff frequency equal to the bandwidth of the PLL. The saturation value corresponds to self referred long term jitter of the PLL. Figure 105 shows the maximum jitter trend versus the number of clock periods N (for some typical CPU frequencies). The curves represent the worst case situations, as they are computed taking into account all temperature ranges, power supplies and process variations. ‘Real’ jitter is always measured well below the given worst case value. Noise in supply and substrate Digital supply noise adds determining elements to PLL output jitter, independent of the multiplication factor. Its effect is strongly reduced thanks to the particular care taken when integrating and implementing the PLL module inside the device. In addition, the contribution of digital noise to global jitter is widely taken into account in the curves provided in Figure 105. Figure 105. ST10F296E PLL jitter N (CPU clock periods) 200 400 ±5 ±1 800 600 1000 1200 1400 0 0 64 MHz ±2 ±3 ±4 24 MHz 40 MHz 32 MHz 16 MHz TJIT Obsolete Product(s) - Obsolete Product(s) |
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