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KMA310 Datasheet(PDF) 28 Page - NXP Semiconductors

Part # KMA310
Description  Programmable angle sensor IC
PDF  71 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

KMA310 Datasheet(HTML) 28 Page - NXP Semiconductors

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NXP Semiconductors
KMA310
Programmable angle sensor IC
KMA310
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2019. All rights reserved.
Product data sheet
Rev. 3 — 27 February 2019
28 / 71
10.7 Self-diagnostic validation support
To validate the correct function of self-diagnostics within the system, enable the
self-diagnostic validation support bit 10 in SYS_SETTING register. In case this bit is
logic 1 the device shows diagnostic modes based on the content of OEM_CODE1
register; see Table 36. In case this bit is logic 0 the device is in normal operating mode
which is the default mode.
Table 36. Self-diagnostic validation support
OEM_CODE1 value
Safety mechanism
Comment
001h
SM-01
magnetic field conversion check
002h
SM-02
inverted angle calculation check
004h
SM-03
data division check
008h
SM-04
data conversion check
010h
SM-05
adjusted angle calculation check
020h
SM-06[1]
control signal check
040h
SM-07[1]
BIST completion check
080h
SM-08[1]
BIST encoding check
100h
SM-09[1]
SD-ADC range check
200h
SM-10[1]
data adder check
400h
SM-11[1]
CORDIC range check
800h
SM-12[1]
angular range check
[1]
Disable the corresponding ASIL mask bits in the ASIL_SETTING register.
11 Limiting values
Table 37. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
Min
Max Unit
VDD
supply voltage
−0.3
+18 V
VO
output voltage
−0.3
+18 V
VO(ov)
overvoltage output voltage
Tamb < 140 °C at t < 1 h
[1] Vth(ov)
18
V
Ir
reverse current
Tamb < 70 °C
-
150 mA
Tamb
ambient temperature
−40
+180 °C
Tamb(pr)
programming ambient temperature
10
70
°C
Tstg
storage temperature
−40
+125 °C
tdiag
diagnostic time
output voltage level ≤ 4 %VDD or ≥ 96 %VDD
-
100 h
Non-volatile memory
tret(D)
data retention time
Tamb = 50 °C
17
-
year
Nendu(W_ER) write or erase endurance
Tamb(pr) = 70 °C
100
-
cycle
[1]
Overvoltage on output and supply within the specified operating voltage range.



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