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R5F5671CDDFM Datasheet(PDF) 155 Page - Renesas Technology Corp |
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R5F5671CDDFM Datasheet(HTML) 155 Page - Renesas Technology Corp |
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155 / 178 page  R01DS0373EJ0110 Rev.1.10 Page 155 of 178 Apr 15, 2022 RX671 Group 2. Electrical Characteristics 2.6 A/D Conversion Characteristics Note: The above specification values apply when there is no access to the external bus during A/D conversion. If access proceeds during A/D conversion, values may not fall within the above ranges. Note 1. The conversion time includes the sampling time and the comparison time. As the test conditions, the number of sampling states is indicated. Note 2. The value in parentheses indicates the sampling time. Note: The above specification values apply when there is no access to the external bus during A/D conversion. If access proceeds during A/D conversion, values may not fall within the above ranges. Note 1. The conversion time includes the sampling time and the comparison time. As the test conditions, the number of sampling states is indicated. Note 2. The value in parentheses indicates the sampling time. Table 2.53 12-Bit A/D (Unit 0) Conversion Characteristics Conditions: VCC = AVCC0 = AVCC1 = VCC_USB = VBATT = 2.7 to 3.6 V, 2.7 V ≤ VREFH0 ≤ AVCC0, VSS = AVSS0 = AVSS1 = VREFL0 = VSS_USB = 0 V, PCLKB = PCLKC = 1 MHz to 60 MHz, Ta = Topr, Source impedance = 1.0 k Ω Item Min. Typ. Max. Unit Test Conditions Resolution 8 — 12 Bit Analog input capacitance — — 30 pF Conversion time*1 (Operation at PCLKC = 60 MHz) 0.48 (0.267)*2 — — µs Sampling in 16 states Offset error — ±1.0 ±2.5 LSB Full-scale error — ±1.0 ±2.5 LSB Quantization error — ±0.5 — LSB Absolute accuracy — ±2.5 ±4.5 LSB DNL differential nonlinearity error — ±0.5 ±1.5 LSB INL integral nonlinearity error — ±1.0 ±2.5 LSB Table 2.54 12-Bit A/D (Unit 1) Conversion Characteristics Conditions: VCC = AVCC0 = AVCC1 = VCC_USB = VBATT = 2.7 to 3.6 V, 2.7 V ≤ VREFH0 ≤ AVCC0, VSS = AVSS0 = AVSS1 = VREFL0 = VSS_USB = 0 V, PCLKB = PCLKD = 1 MHz to 60 MHz, Ta = Topr, Source impedance = 1.0 k Ω Item Min. Typ. Max. Unit Test Conditions Resolution 8 — 12 Bit Conversion time*1 (Operation at PCLKD = 60 MHz) 0.88 (0.633)*2 — — µs Sampling in 38 states (ADSAM.SAM = 1) Conversion time*1 (Operation at PCLKD = 30 MHz) 1 (0.500)*2 — — µs Sampling in 15 states (ADSAM.SAM = 1) Analog input capacitance — — 30 pF Offset error — ±2.0 ±3.5 LSB Full-scale error — ±2.0 ±3.5 LSB Quantization error — ±0.5 — LSB Absolute accuracy — ±4.0 ±6.0 LSB DNL differential nonlinearity error (Operation at PCLKD = 60 MHz) — ±1.5 ±4.0 LSB DNL differential nonlinearity error (Operation at PCLKD = 30 MHz) — ±1.5 ±2.5 LSB INL integral nonlinearity error (Operation at PCLKD = 60 MHz) — ±2.0 ±4.0 LSB INL integral nonlinearity error (Operation at PCLKD = 30 MHz) — ±2.0 ±3.5 LSB |
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