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STM32C011F6U6 Datasheet(PDF) 40 Page - STMicroelectronics

Part # STM32C011F6U6
Description  Arm® Cortex®-M0 32-bit MCU, 32 KB Flash, 6 KB RAM,2 x USART, timers, ADC, comm. I/Fs, 2-3.6 V
PDF  94 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32C011F6U6 Datasheet(HTML) 40 Page - STMicroelectronics

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Electrical characteristics
STM32C011x4/x6
40/94
DS13866 Rev 3
5.3.4
Embedded voltage reference
The parameters given in Table 26 are derived from tests performed under the ambient
temperature and supply voltage conditions summarized in Table 23: General operating
conditions.
VBOR1
Brownout reset threshold 1
VDD rising
2.05
2.10
2.18
V
VDD falling
1.95
2.00
2.08
VBOR2
Brownout reset threshold 2
VDD rising
2.20
2.31
2.38
V
VDD falling
2.10
2.21
2.28
VBOR3
Brownout reset threshold 3
VDD rising
2.50
2.62
2.68
V
VDD falling
2.40
2.52
2.58
VBOR4
Brownout reset threshold 4
VDD rising
2.80
2.91
3.00
V
VDD falling
2.70
2.81
2.90
Vhyst_POR_PDR
Hysteresis of VPOR and VPDR
--
20
-
mV
Vhyst_BOR
Hysteresis of VBORx
-
-
100
-
mV
IDD(BOR)(1)
BOR consumption
-
-
2.2
2.5
µA
1. Specified by design – Not tested in production.
Table 25. Embedded reset and power control block characteristics (continued)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Table 26. Embedded internal voltage reference
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VREFINT
Internal reference voltage
-
1.182 1.212
1.232
V
tS_vrefint (1)(2)
ADC sampling time when reading
the internal reference voltage
-4
-
-
µs
tstart_vrefint(2)
Start time of reference voltage
buffer when ADC is enable
--
8
12
µs
IDD(VREFINTBUF)(2)
VREFINT buffer consumption from
VDD when converted by ADC
-
9
13.5
23
µA
∆VREFINT(2)
Internal reference voltage spread
over the temperature range
VDD = 3 V
-
30
50
mV
TCoeff
Averange temperature coefficient
-
-
20
70
ppm/°C
ACoeff
Long term stability
1000 hours, T = 25 °C
-
300
1000
ppm
VDDCoeff
Voltage coefficient
3.0 V < VDD < 3.6 V
-
250
1200
ppm/V
1. The shortest sampling time can be determined in the application by multiple iterations.
2. Specified by design – Not tested in production.



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