IIS2DULPX datasheet(16/106 Pages) STMICROELECTRONICS

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3.5

Interrupt event recognition

The device may be configured to generate interrupt signals coming from an independent inertial wake-up/free-fall

event or from the position of the device itself. The thresholds and timing of this interrupt generator are

programmable by the end user in runtime.

Automatic programmable sleep-to-wake-up and return-to-sleep functions are also available for enhanced power

saving.

The device interrupts signal can behave as:

•

Free-fall: 3-axis underthreshold recognition

•

Wake-up: axis recognition

•

Wake-to-sleep: change of state recognition active-sleep (also known as activity-inactivity)

•

6D and 4D orientation detection: change of position recognition

•

Tap-tap: single/double/triple-tap detection

All these functions are parallel, but during sleep, it is not possible to recognize a tap-tap event. All these signals

can be driven to the two interrupt pins (INT1 and INT2) through registers MD1_CFG (1Fh) and MD2_CFG (20h).

All these functions are enabled by setting the INTERRUPTS_ENABLE bit in register INTERRUPT_CFG (17h) to

It is possible to configure the duration of the interrupt using the LIR bit in INTERRUPT_CFG (17h) as shown in the

following table.

Table 9. Configuration of duration of interrupt

LIR

Interrupt type

Level mode

Latched mode

•

Interrupt level mode: the interrupt signal goes high when an interrupt event occurs and is reset when the

acceleration data fall below the threshold.

•

Interrupt latched mode: the interrupt signal on the INT1/INT2 pins is the OR of the interrupt flags enabled

through the MD1_CFG (1Fh) and MD2_CFG (20h) registers. Each interrupt flag goes to 1 when an

interrupt event occurs and is reset when the dedicated source register is read. The interrupt generator

block is inhibited 1 ODR after the reset event. It is possible to reset all the interrupt flags simultaneously by

reading the ALL_INT_SRC (24h) register.

3.6

Accelerometer self-test

Self-test mode allows checking the functionality of the sensor without moving it, applying an actuation force to the

sensor, and simulating a definite input acceleration.

The procedures for the positive and negative self-test are described in the device application note AN6059.

3.7

Temperature sensor

The temperature is available in OUT_T_AH_QVAR_L (2Eh), OUT_T_AH_QVAR_H (2Fh) stored as two's

complement data, left-justified in 12-bit mode.

Refer to Table 5. Temperature sensor characteristics for the conversion factor.

IIS2DULPX

Functionality

DS14580 - Rev 1

page 16/106

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