LMH6570

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SNCS104D – APRIL 2005 – REVISED DECEMBER 2014

6.5 Electrical Characteristics ±5V

VS = ±5 V, RL = 100 Ω, RF = 576 Ω, AV = 2 V/V, TJ = 25 °C, unless otherwise specified.

PARAMETER

TEST CONDITIONS(1)

MIN(2)

TYP(3)

MAX(2)

UNIT

FREQUENCY DOMAIN PERFORMANCE

SSBW

−3 dB Bandwidth

VOUT = 0.5 VPP

500

MHz

LSBW

–3 dB Bandwidth

VOUT = 2 VPP

(4)

400

MHz

.1 dBBW

0.1 dB Bandwidth

VOUT = 0.25 VPP

150

MHz

DG

Differential gain

RL = 150 Ω, f = 4.43 MHz

0.02%

DP

Differential phase

RL = 150 Ω, f = 4.43 MHz

0.05

deg

XTLK

Channel to channel crosstalk

All Hostile, f = 5 MHz

−70

dBc

TIME DOMAIN RESPONSE

Channel to channel switching

ns

TRS

Logic transition to 90% output

8

time

Enable and disable times

Logic transition to 90% or 10% output.

10

ns

TRL

Rise and fall time

4 V Step

2.4

ns

TSS

Settling time to 0.05%

2 V Step

17

ns

OS

Overshoot

2 V Step

5%

SR

Slew rate

4 V Step(4)(5)

2200

V/

μs

DISTORTION

HD2

2nd Harmonic distortion

2 VPP , 5 MHz

−68

dBc

HD3

3rd Harmonic distortion

2 VPP , 5 MHz

−84

dBc

3rd Order intermodulation

dBc

IMD

10 MHz, Two tones 2 Vpp at output

−80

products

EQUIVALENT INPUT NOISE

VN

Voltage

>1 MHz, Input Referred

5

nV

√HZ

ICN

Current

>1 MHz, Input Referred

5

pA/

√Hz

STATIC, DC PERFORMANCE

±0.005%

±0.034%

Channel to channel gain

DC, Difference in gain

CHGM

difference

between channels

-40°C

≤ TJ ≤ 85°C

±0.036%

1

±15

mV

VIO

Input offset voltage

VIN = 0 V

-40°C

≤ TJ ≤ 85°C

±21

DVIO

Offset voltage drift(6)

30

µV/°C

−3

±8

µA

IBN

Input bias current(7)

VIN = 0 V

-40°C

≤ TJ ≤ 85°C

±10

DIBN

Bias current drift(6)

11

nA/°C

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

limited self-heating of the device such that TJ = TA. No specification of parametric performance is indicated in the electrical tables under

conditions of internal self heating where TJ > TA. See Thermal Information for information on temperature de-rating of this device.

Min/Max ratings are based on product testing, characterization and simulation. Individual parameters are tested as noted.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are ensured through correlation using Statistical

Quality Control (SQC) methods.

(3)

Typical numbers are the most likely parametric norm.

(4)

Parameter ensured by design.

(5)

Slew Rate is the average of the rising and falling edges.

(6)

Drift determined by dividing the change in parameter at temperature extremes by the total temperature change.

(7)

Positive Value is current into device.

Copyright © 2005–2014, Texas Instruments Incorporated

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