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COMBOSMARTMETER Datasheet(PDF) 2 Page - Texas Instruments

Part # COMBOSMARTMETER
Description  Analog Front-End for Power Monitoring, Control, and Protection
PDF  60 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

COMBOSMARTMETER Datasheet(HTML) 2 Page - Texas Instruments

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ADS131E04
ADS131E06
ADS131E08
SBAS561A – JUNE 2012 – REVISED APRIL 2013
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FAMILY AND ORDERING INFORMATION(1)
OPERATING
NUMBER OF
MAXIMUM SAMPLE
TEMPERATURE
PRODUCT
PACKAGE OPTION
CHANNELS
ACCURACY
RATE (kSPS)
RANGE
ADS130E08
TQFP-64
8
Class 1.0
8
–40°C to +105°C
ADS131E04
TQFP-64
4
Class 0.1
64
–40°C to +105°C
ADS131E06
TQFP-64
6
Class 0.1
64
–40°C to +105°C
ADS131E08
TQFP-64
8
Class 0.1
64
–40°C to +105°C
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
VALUE
UNIT
AVDD to AVSS
–0.3 to +5.5
V
DVDD to DGND
–0.3 to +3.9
V
Analog input to AVSS
AVSS – 0.3 to AVDD + 0.3
V
Digital input to DVDD
DGND – 0.3 to DVDD + 0.3
V
Input current to any pin except supply pins(2)
±10
mA
Momentary
±100
mA
Input current
Continuous
±10
mA
Operating, industrial-grade devices only
–40 to +85
°C
Temperature
Storage
–60 to +150
°C
Maximum junction, TJ
+150
°C
Human body model (HBM)
±1000
V
JEDEC standard 22, test method A114-C.01, all pins
Electrostatic discharge
(ESD) ratings
Charged device model (CDM)
±500
V
JEDEC standard 22, test method C101, all pins
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2)
Input terminals are diode-clamped to the power-supply rails. Input signals that can swing beyond the supply rails must be current limited
to 10 mA or less.
2
Submit Documentation Feedback
Copyright © 2012–2013, Texas Instruments Incorporated
Product Folder Links: ADS131E04 ADS131E06 ADS131E08



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