LM26LV

TRIP TEST

2

GND

3

OVERTEMP

5

OVERTEMP

4

1

NC

6

RESET

Momentary

100k

LM26LV

TRIP TEST

2

GND

5

OVERTEMP

3

OVERTEMP

4

1

100k

NC

6

R1

4.1V

R3

R2

0.1 PF

U3

LM4040

R4

V+

+

-

U1

LM26LV

U2

(High = overtemp alarm)

R1 + R2||R3

(4.1)R2

R2 + R1||R3

(4.1)R2

LM26LV

SNIS144F – JULY 2007 – REVISED FEBRUARY 2013

www.ti.com

Figure 26. Celsius Temperature Switch

Figure 27. TRIP TEST Digital Output Test Circuit

Figure 28. Latch Circuit using OVERTEMP Output

The TRIP TEST pin, normally used to check the operation of the OVERTEMP and OVERTEMP pins, may be

used to latch the outputs whenever the temperature exceeds the programmed limit and causes the digital outputs

to assert. As shown in Figure 28, when OVERTEMP goes high the TRIP TEST input is also pulled high and

causes OVERTEMP output to latch high and the OVERTEMP output to latch low. The latch can be released by

either momentarily pulling the TRIP TEST pin low (GND), or by toggling the power supply to the device. The

resistor limits the current out of the OVERTEMP output pin.

22

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