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SCANSTA101SM/NOPB Datasheet(PDF) 15 Page - Texas Instruments

Part # SCANSTA101SM/NOPB
Description  SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
PDF  42 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

SCANSTA101SM/NOPB Datasheet(HTML) 15 Page - Texas Instruments

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SCANSTA101
www.ti.com
SNLS057J – MAY 2002 – REVISED APRIL 2013
The SCANSTA101 memory is organized in big endian format. A memory write is accomplished by two
consecutive writes to the same location. When embedded software loads the TDO_SM memory, the least
significant 16 bits are written first and then the most significant 16 bits. Therefore, when the Sequencer or a
Vector is initialized the SSIC can directly fetch and load the long word to the TDO_SM shifter without any
modification.
Figure 3. TMS_SM Shifter
Figure 4. TDO_SM Shifter
Figure 5. TDI_SM Shifter
Reading from TDI_SM memory is accomplished by two consecutive reads. When reading from the TDI_SM
memory, the first read will contain the least significant 16 bits and the second read the most significant 16 bits.
The TDI_SM shifter unit consists of two 32-bit shift registers as shown in Figure 5. The shift register on top in the
figure is the LFSR register. Before using the TDI_SM LFSR register, the LFSR Exponent and LFSR Seed
registers must be written with valid data. The LFSR Exponent register must be written with a 3-bit binary
encoded value that selects one of the five available polynomials. The value written to the LFSR Seed registers is
used to initialize the TDI_SM LFSR register to a predetermined state. Once the test vector has completely
scanned in, the final contents of the LFSR register are transferred to the LFSR Result registers.
Copyright © 2002–2013, Texas Instruments Incorporated
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