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PD46185092B Datasheet(PDF) 29 Page - Renesas Technology Corp |
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PD46185092B Datasheet(HTML) 29 Page - Renesas Technology Corp |
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29 / 36 page ![]() μPD46185092B, μPD46185182B, μPD46185362B R10DS0112EJ0200 Rev.2.00 Page 29 of 35 Nov 09, 2012 Boundary Scan Register Status of Output Pins CQ, CQ# and Q Instructions SRAM Status Boundary Scan Register Status Note CQ,CQ# Q EXTEST READ (Low-Z) Pad Pad NOP (High-Z) Pad Pad IDCODE READ (Low-Z) – – No definition NOP (High-Z) – – SAMPLE-Z READ (Low-Z) Pad Pad NOP (High-Z) Pad Pad SAMPLE READ (Low-Z) Internal Internal NOP (High-Z) Internal Pad BYPASS READ (Low-Z) – – No definition NOP (High-Z) – – Remark The Boundary Scan Register statuses during execution each instruction vary according to the instruction code and SRAM operation mode. There are two statuses: Pad : Contents of the output pin (QDR Pad) are captured in the “CAPTURE Register” in the Boundary Scan Register. Internal : Contents of the SRAM internal output “SRAM Output” are captured in the “CAPTURE Register” in the Boundary Scan Register. Pad Internal SRAM Output Driver Update Register QDR Pad High-Z JTAG ctrl CAPTURE Register SRAM Output Boundary Scan Register |
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