DS90C3201

SNLS192D – APRIL 2005 – REVISED APRIL 2013

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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

Absolute Maximum Ratings

(1)

−0.3V to +4V

LVCMOS/LVTTL Input Voltage

LVCMOS/LVTTL Output Voltage

LVDS Output Voltage

LVDS Short Circuit Duration

Continuous

Junction Temperature

+150°C

Storage Temperature

−65°C to +150°C

Lead Temperature

(Soldering, 10 seconds)

+260°C

Maximum Package Power Dissipation Capacity at 25°C

128 TQFP Package

1.4W

Package Derating

25.6mW/°C above +25°C

HBM, 1.5k

Ω, 100pF

> 2 kV

ESD Rating

EIAJ, 0

Ω, 200pF

> 200 V

(1)

“Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be ensured. They are not meant to imply

that the device should be operated at these limits. The tables of “Electrical Characteristics” specify conditions for device operation.

Recommended Operating Conditions

Min

Nom

Max

Unit

3.15

3.3

3.6

V

Operating Free Air

0

+25

+70

°C

±100

Transmitter Input Range

0

V

Input Clock Frequency (f)

8

135

MHz

7.4

125

ns

Electrical Characteristics

(1) (2) (3)

Over recommended operating supply and temperature ranges unless otherwise specified.

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

LVCMOS/LVTTL DC SPECIFICATIONS (Tx inputs, control inputs)

High Level Input Voltage

2.0

V

Low Level Input Voltage

0

0.8

V

Input Clamp Voltage

−0.8

−1.5

V

Input Current

0V

+10

µA

−10

0

µA

LVDS TRANSMITTER DC SPECIFICATIONS

Differential Output Voltage

200

400

620

mV

(Programmable register)

bit [5] (TXE) = 0b,

bit [4] (TXO) = 0b (Default)

100

250

400

mV

bit [5] (TXE) = 1b,

bit [4] (TXO) = 1b

50

mV

complimentary output states

(1)

(2)

Current into device pins is defined as positive. Current out of device pins is defined as negative. Voltages are referenced to ground

unless otherwise specified.

(3)

The Minimum and Maximum Limits are based on statistical analysis of the device performance over process, voltage and temperature

ranges. This parameter is functional tested only on Automatic Test Equipment (ATE).

4

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