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STM32U5A5QJ Datasheet(PDF) 328 Page - STMicroelectronics

Part # STM32U5A5QJ
Description  Ultra-low-power Arm® Cortex®-M33 32-bit MCUTrustZone®FPU,240 DMIPS, 4 MB Flash, 2.5 MB SRAM, LTDC, MIPI® DSI, crypto
PDF  382 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32U5A5QJ Datasheet(HTML) 328 Page - STMicroelectronics

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Electrical characteristics
STM32U5Axxx
328/382
DS13543 Rev 1
5.3.35
OCTOSPI characteristics
Unless otherwise specified, the parameters given in Table 139 toTable 141 are derived from
tests performed under the ambient temperature, fAHB frequency and VDD supply voltage
conditions summarized in Table 33, with the following configuration:
•
Output speed set to OSPEEDRy[1:0] = 10
•
Delay block enabled for DTR (with DQS)/HyperBus
•
Measurement points done at 0.5 × VDD level
•
I/O compensation cell activated
•
HSLV activated when VDD ≤ 2.7 V
•
Voltage scaling range 1 unless otherwise specified
Refer to Section 5.3.14: I/O port characteristics for more details on the input/output alternate
function characteristics.
Table 137. Switching characteristics for NAND Flash read cycles(1)
Symbol
Parameter
Min
Max
Unit
tw(N0E)
FMC_NOE low width
4 × tHCLK - 0.5 4 × tHCLK + 0.5
ns
tsu(D-NOE)
FMC_D[15-0] valid data before FMC_NOE high
13
-
th(NOE-D)
FMC_D[15-0] valid data after FMC_NOE high
0
-
td(ALE-NOE)
FMC_ALE valid before FMC_NOE low
-
3 × tHCLK + 0.5
th(NOE-ALE)
FMC_NWE high to FMC_ALE invalid
4 × tHCLK - 1
-
1. Evaluated by characterization. Not tested in production.
Table 138. Switching characteristics for NAND Flash write cycles(1)
Symbol
Parameter
Min
Max
Unit
tw(NWE)
FMC_NWE low width
4 × tHCLK - 0.5
4 × tHCLK + 0.5
ns
tv(NWE-D)
FMC_NWE low to FMC_D[15-0] valid
0
-
th(NWE-D)
FMC_NWE high to FMC_D[15-0] invalid
2 × tHCLK + 1
-
td(D-NWE)
FMC_D[15-0] valid before FMC_NWE high
5 × tHCLK - 5
-
td(ALE_NWE)
FMC_ALE valid before FMC_NWE low
-
3 × tHCLK + 0.5
th(NWE-ALE)
FMC_NWE high to FMC_ALE invalid
2 × tHCLK - 0.5
-
1. Evaluated by characterization. Not tested in production.



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