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NAND01G-B2C Datasheet(PDF) 41 Page - Numonyx B.V |
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NAND01G-B2C Datasheet(HTML) 41 Page - Numonyx B.V |
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41 / 67 page ![]() NAND01G-B2C Software algorithms 41/67 8 Software algorithms This section gives information on the software algorithms that Numonyx recommends to implement to manage the bad blocks and extend the lifetime of the NAND device. NAND flash memories are programmed and erased by Fowler-Nordheim tunneling using a high voltage. Exposing the device to a high voltage for extended periods can cause the oxide layer to be damaged. For this reason, the number of program and erase cycles is limited (see Table 18 for value) and it is mandatory to implement error correction code algorithms to extend the number of program and erase cycles and increase data retention. To help integrate a NAND memory into an application, Numonyx can provide a full range of software solutions: file system, sector manager, drivers and code management. Contact the nearest Numonyx sales office or visit www.numonyx.com for more details. 8.1 Bad block management Devices with bad blocks have the same quality level and the same AC and DC characteristics as devices where all the blocks are valid. A bad block does not affect the performance of valid blocks because it is isolated from the bit line and common source line by a select transistor. The devices are supplied with all the locations inside valid blocks erased (FFh). The bad block information is written prior to shipping. Any block, where the 1st and 6th bytes (x8 device)/1st word (x16 device), in the spare area of the 1st page, does not contain FFh, is a bad block. The bad block Information must be read before any erase is attempted as the bad block information may be erased. For the system to be able to recognize the bad blocks based on the original information it is recommended to create a bad block table following the flowchart shown in Figure 18. 8.2 NAND flash memory failure modes Over the lifetime of the device additional bad blocks may develop. To implement a highly reliable system, all the possible failure modes must be considered: ● Program/erase failure: in this case the block has to be replaced by copying the data to a valid block. These additional bad blocks can be identified as attempts to program or erase them will give errors in the status register As the failure of a page program operation does not affect the data in other pages in the same block, the block can be replaced by re-programming the current data and copying the rest of the replaced block to an available valid block. The Copy Back Program command can be used to copy the data to a valid block. See Section 6.4: Copy back program for more details ● Read failure: in this case, ECC correction must be implemented. To efficiently use the memory space, it is recommended to recover single-bit error in read by ECC, without replacing the whole block. Refer to Table 17 for the procedure to follow if an error occurs during an operation. |
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