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EVALAD5933EB Datasheet(PDF) 22 Page - Analog Devices |
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EVALAD5933EB Datasheet(HTML) 22 Page - Analog Devices |
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22 / 32 page ![]() EVAL-AD5933EB Preliminary Technical Data Rev. PrC | Page 22 of 32 For example, assume the following: • The unknown test impedance limits are defined by kΩ 220 kΩ 180 ≤ ≤ UNKNOWN Z • The frequency range of interest is 30 kHz and 32 kHz • The following are the system calibration gain settings: VDD = 3.3 V Gain setting resistor (RFB) = 200 kΩ ZCALIBRATION = 200 kΩ PGA setting = ×1 Calibration frequency = 31 kHz (midpoint frequency) The gain factor calculated at the midpoint frequency of 31 kHz can be used to calculate any impedance in the 180 kΩ to 220 Ω range. If the unknown impedance span or the frequency sweep is too large, the accuracy of the calculated impedance measurement degrades. In addition, if any of the calibration system gain settings change, you must recalibrate the AD5933 and recalculate the gain factor (see the AD5933 data sheet for further details). Measuring Small Impedances The AD5933 is capable of measuring impedance values of up to 10 MΩ if the system gain settings are chosen correctly for the impedance subrange of interest. However, there are two points to understand when measuring small impedances with the AD5933. First, if the user places a small impedance value (< ≈ 500 Ω over the sweep frequency of interest) between the VOUT and VIN pins, the signal current flowing through the impedance for a fixed excitation voltage increases in accordance with Ohm’s law. The output stage of the transmit side amplifier that is available at the VOUT pin may not be able to provide the required increase in current through the impedance. In addition, to ensure a unity gain condition on the receive side I-V amplifier, there must be a similar small value of feedback resistance for system calibration, as outlined in the Calibrating the AD5933 section. The voltage presented at the VIN pin is hard biased at VDD/2 due to the virtual earth on the receive side I-V amplifier (see the AD5933 data sheet for further details). The increased current’s sink/source requirement on the output of the receive side I-V amplifier may also cause the amplifier to operate outside of the linear region, resulting in significant errors in subsequent impedance measurements. Second, the value of the output series resistance (ROUT see Figure 28 ) at the VOUT pin of the AD5933 must be taken into account when measuring small impedances (ZUNKNOWN), specifically when the value of the output series resistance is comparable to the value of the impedance being tested (ZUNKNOWN). If the ROUT value is unaccounted for in the system calibration (that is, the gain factor calculation) when measuring small impedances, an error will be introduced in subsequent impedance measurements. (The error introduced depends on the relative magnitude of the impedance being tested compared with the value of the output series resistance.) The value of the output series resistance depends on the selected output excitation range at VOUT, and, like with all discrete resistors manufactured in a silicon fabrication process, the tolerance varies from device to device. Typical values of the output series resistance are listed in Table 6. Table 6. Output Series Resistance (ROUT) vs. Excitation Range Parameter Value (Typ) Output Series Resistance Value (Typ) Range 1 2 V p-p 200 Ω Range 2 1 V p-p 2.4 kΩ Range 3 0.4 V p-p 1.0 kΩ Range 4 0.2 V p-p 600 Ω Therefore, to accurately calibrate the AD5933 to measure small impedances, it is necessary to reduce the signal current by sufficiently attenuating the excitation voltage and to account for the output series resistance value (ROUT) by factoring it into the gain factor calculation (see the AD5933 data sheet for further details). During device characterization, measuring the output series resistance value (ROUT) was achieved by selecting the appropriate output excitation range at VOUT and then sinking and sourcing a known current (for example, ±2 mA) at the pin and measuring the change in dc voltage. The output series resistance was cal- culated by measuring the inverse of the slope (that is, 1/slope) of the resultant I-V plot. A circuit that helps to minimize the effects of the two previously described issues is shown in Figure 28. The aim of this circuit is to place the AD5933 system gain within its linear range when measuring small impedances by using an additional external amplifier circuit along the signal path. The external amplifier attenuates the peak-to-peak excitation voltage at VOUT if the user chooses suitable values for Resistors R1 and R2. This reduces the signal current flowing through the impedance and minimizing the effect of the output series resistance in the impedance calculations. In the circuit shown in Figure 28, the impedance being tested (ZUNKNOWN) sees the output series resistance of the external amplifier. This value is typically much less than 1 Ω with feedback applied, depending on the op amp device (for example, AD820, AD8641, or AD8531), the load current, the bandwidth, and the gain. The key point is that the output impedance of the external amplifier in Figure 28, which is also in series with the impedance being tested (ZUNKNOWN), has a far less significant |
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