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LIS2DS12 Datasheet(PDF) 16 Page - STMicroelectronics

Part # LIS2DS12
Description  ultra-low-power high-performance 3-axis "pico" accelerometer
PDF  68 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

LIS2DS12 Datasheet(HTML) 16 Page - STMicroelectronics

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Mechanical and electrical specifications
LIS2DS12
16/68
DocID027753 Rev 4
Table 8. I2C high-speed mode specifications at 1 MHz and 3.4 MHz
Symbol
Parameter
Min
Max
Unit
Fast mode
plus(1)
fSCL
SCL clock frequency
0
1
MHz
tHD;STA
Hold time (repeated) START condition
260
-
ns
tLOW
Low period of the SCL clock
500
-
tHIGH
High period of the SCL clock
260
-
tSU;STA
Setup time for a repeated START condition
260
-
tHD;DAT
Data hold time
0
-
tSU;DAT
Data setup time
50
-
trDA
Rise time of SDA signal
-
120
tfDA
Fall time of SDA signal
-
120
trCL
Rise time of SCL signal
20*Vdd/5.5
120
tfCL
Fall time of SCL signal
20*Vdd/5.5
120
tSU;STO
Setup time for STOP condition
260
-
Cb
Capacitive load for each bus line
-
550
pF
tVD;DAT
Data valid time
-
450
ns
tVD;ACK
Data valid acknowledge time
-
450
VnL
Noise margin at low level
0.1Vdd
-
V
VnH
Noise margin at high level
0.2Vdd
-
tSP
Pulse width of spikes that must be suppressed
by the input filter
050
ns
High-speed
mode(1)
fSCLH
SCLH clock frequency
0
3.4
MHz
tSU;STA
Setup time for a repeated START condition
160
-
ns
tHD;STA
Hold time (repeated) START condition
160
-
tLOW
Low period of the SCLH clock
160
-
tHIGH
High period of the SCLH clock
60
-
tSU;DAT
Data setup time
10
-
tHD;DAT
Data hold time
0
70
trCL
Rise time of SCLH signal
10
40
trCL1
Rise time of SCLH signal after a repeated
START condition and after an acknowledge bit
10
80
tfCL
Fall time of SCLH signal
10
40
trDA
Rise time of SDAH signal
10
80
tfDA
Fall time of SDAH signal
10
80
tSU;STO
Setup time for STOP condition
160
-
Cb
Capacitive load for each bus line
-
100
pF
VnH
Noise margin at high level
0.2Vdd
-
V
tSP
Pulse width of spikes that must be suppressed
by the input filter
010
ns
1. Data based on characterization, not tested in production



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