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STM32F103XC Datasheet(PDF) 105 Page - STMicroelectronics

Part # STM32F103XC
Description  Performance line, ARM-based 32-bit MCU with up to 512 KB Flash, USB, CAN, 11 timers, 3 ADCs and 13 communication interfaces
PDF  118 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F103XC Datasheet(HTML) 105 Page - STMicroelectronics

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STM32F103xC, STM32F103xD, STM32F103xE
Electrical characteristics
105/118
5.3.20
Temperature sensor characteristics
Amplifier
gain
Gain of the amplifier in open
loop
80
85
dB
with a 5 k
Ω load (worst case)
tSETTLING
Settling time (full scale: for an
10-bit input code transition
between the lowest and the
highest input codes when
DAC_OUT reaches final value
±1LSB
34
µs
CLOAD ≤ 50 pF,
RLOAD ≥ 5 kΩ
Update
rate
Max frequency for a correct
DAC_OUT change when small
variation in the input code (from
code i to i+1LSB)
1MS/s
CLOAD ≤ 50 pF,
RLOAD ≥ 5 kΩ
tWAKEUP
Wakeup time from off state
(PDV18 from 1 to 0)
6.5
10
µs
CLOAD ≤ 50 pF,
RLOAD ≥ 5 kΩ
input code between lowest and
highest possible ones.
PSRR+
Power supply rejection ratio (to
VDD33A) (static DC
measurement
–67
–40
dB
No RLOAD, CLOAD = 50 pF
1.
Guaranteed by characterization, not tested in production.
Table 61.
DAC characteristics (continued)
Symbol
Parameter
Min
Typ
Max(1)
Unit
Comments
Table 62.
TS characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
TL
(1)
VSENSE linearity with temperature
±1
±2
°C
Avg_Slope(1)
Average slope
4.0
4.3
4.6
mV/°C
V25
(1)
Voltage at 25 °C
1.34
1.43
1.52
V
tSTART
(2)
Startup time
4
10
µs
TS_temp
(3)(2)
ADC sampling time when reading the
temperature
2.2
17.1
µs
1.
Guaranteed by characterization, not tested in production.
2.
Data guaranteed by design, not tested in production.
3.
Shortest sampling time can be determined in the application by multiple iterations.



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