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TDSUSBF Datasheet(PDF) 27 Page - TEKTRONIX, INC. |
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TDSUSBF Datasheet(HTML) 27 Page - TEKTRONIX, INC. |
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27 / 46 page ![]() Trigger Analog Channels MSO Logic Channels Description Serial Pattern 2 X Trigger on NRZ-encoded data up to 6.25 Gbaud; above 1.25 Gbaud requires 8b/10b encoded data. Includes pattern lock triggering to capture repeated acquisitions of long serial test patterns up to 6.25 Gb/s. Setup/Hold X Trigger on violations of both setup time and hold time between clock and data present on any two input channels. State X X Any logical pattern of channels (1, 2, 3) (and 16 logic channels on the MSO70000 Series) clocked by edge on channel 4. Trigger on rising or falling clock edge. Timeout X X Trigger on an event which remains high, low, or either, for a specified time period. Selectable from 300 ps. Transition X Trigger on pulse edge rates that are faster or slower than specified. Slope may be positive, negative, or either. Trigger Delay by Events X X 1 to 2 billion events. Trigger Delay by Time X X 3.2 ns to 3 million seconds. Visual Trigger 3 X Trigger when the Visual Trigger expression is satisfied. Width X X Trigger on width of positive or negative pulse either within or out of selectable time limits (down to 150 ps). Window X Trigger on an event that enters or exits a window defined by two user-adjustable thresholds. Event can be time or logic qualified. Waveform analysis Search and Mark Events Search for edges, glitches, or pulses of specified width. Any events found matching the search criteria are marked and placed in the Event table. The search can use positive/negative slopes or both on any channels. When an event of interest is found, other similar events can be found using "Mark All Trigger Events in Record" in the Pinpoint trigger control windows. The Event table summarizes all found events. All events are time stamped in reference to trigger position. Users can choose to stop acquisitions when an event is found. Waveform measurements Automatic measurements 53, of which 8 can be displayed on-screen at any one time; measurement statistics, user-definable reference levels, measurement within gates isolating the specific occurrence within an acquisition to measure The DPOJET Jitter and Eye Analysis application offers additional automated and advanced measurements such as jitter. Amplitude related Amplitude, High, Low, Maximum, Minimum, Peak-to-Peak, Mean, Cycle Mean, RMS, Cycle RMS, Positive Overshoot, Negative Overshoot Time related Rise Time, Fall Time, Positive Width, Negative Width, Positive Duty Cycle, Negative Duty Cycle, Period, Frequency, Delay Combination Area, Cycle Area, Phase, Burst Width Histogram related Waveform Count, Hits in Box, Peak Hits, Median, Maximum, Minimum, Peak-to-Peak, Mean (μ), Standard Deviation (sigma), μ +1sigma, μ +2sigma, μ +3sigma Digital and Mixed Signal Oscilloscopes – MSO/DPO70000 Series Pinpoint® trigger system www.tek.com 27 |
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