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TDSUSBF Datasheet(PDF) 10 Page - TEKTRONIX, INC.

Part # TDSUSBF
Description  Digital and Mixed Signal Oscilloscopes
PDF  46 Pages
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Manufacturer  TEKTRONIX [TEKTRONIX, INC.]
Direct Link  https://www.tek.com/
Logo TEKTRONIX - TEKTRONIX, INC.

TDSUSBF Datasheet(HTML) 10 Page - TEKTRONIX, INC.

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PCI Express® Transmitter Compliance and Debug (Option PCE3) – Analyze the
performance of your PCI Express® Rev 1.0, 2.0, or 3.0 (draft spec) design with
comprehensive test support. Using DPOJET, Option PCE3 enables tests that conform to
PCI-SIG standards.
NRZ and PAM4 measurements-The throughput of Datacom networks continues to
increase. Tek's DPO73304DX supports up to 10GBASE KRn data rates. The powerful
combination of the DPO70000, DPOJET Jitter and Noise Analysis, and the SDLA Serial
Data Link Analysis tool performs accurate de-embedding and eye diagram analysis for
Datacom standards.
For more information on PAM4 testing, please refer to the DPO70000SX
datasheet and related PAM4 documents.
Ethernet Compliance Test Solution (Option ET3) – Receive full PHY layer support for
Ethernet variants 10BASE-T, 100BASE-TX, and 1000BASE-T with the comprehensive,
integrated Tektronix® Ethernet tool set. Analog verification, automated compliance
software, and device characterization solutions are all included.
C-PHY uses a unique mechanism for clock recovery. C-PHY 1.0 implements a custom
clock recovery algorithm referred to as triggered eye. In this model, the first zero crossing
of the four differential signals is used as a trigger point for clock recovery and rendering
the eye diagram. The eye mask is optimally placed for maximum eye opening where the
eye height is measured. Because of the triggered eye mechanism, all the jitter at the
trigger point (zero crossing) is swallowed and reflected on the other side. Jitter and eye
diagram rendering performed over the entire record length helps designers better
characterize devices by displaying anomalies of the device over an extended period. The
software allows you to run the eye diagram analysis for 3M UI and overnight runs for a
detailed characterization.
Datasheet
10 www.tek.com



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