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TDSUSBF Datasheet(PDF) 14 Page - TEKTRONIX, INC.

Part # TDSUSBF
Description  Digital and Mixed Signal Oscilloscopes
PDF  46 Pages
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Manufacturer  TEKTRONIX [TEKTRONIX, INC.]
Direct Link  https://www.tek.com/
Logo TEKTRONIX - TEKTRONIX, INC.

TDSUSBF Datasheet(HTML) 14 Page - TEKTRONIX, INC.

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Protocol and Electrical Views of an HSS Bus. The data in the results table and the
acquired waveform are time correlated, enhancing the ability to identify possible causes
of protocol errors due to electrical signaling.
Both the 8b/10b serial bus trigger and the advanced search and mark
feature on the oscilloscope are integrated with the HSS protocol decode to
quickly isolate events of interest in a HSS data stream.
User-selectable bandwidth limit filters
While wide bandwidth is needed to characterize your high-speed serial
designs, certification testing can require a specific instrument bandwidth
appropriate for the signal's data rate in order to correlate test results
between different test labs. The MSO/DPO70000 Series feature user-
selectable bandwidth limiting filters. Using these bandwidth limit filters
which range from 500 MHz to 32 GHz, you will ensure that your
measurement is done using the bandwidth specified by the industry
standard.
Debugging
Throughout the design cycle, MSO/DPO70000 Series oscilloscopes
provide the ability to debug malfunctioning subsystems and isolate the
cause. With the high waveform capture rate of FastAcq® you can quickly
identify signal anomalies that occur intermittently – saving minutes, hours,
or even days by quickly revealing the nature of faults so sophisticated
trigger modes can be applied to isolate them. Using Pinpoint® triggers,
infrequent events such as glitches or signal runts caused by bus contention
or signal integrity issues can be captured, analyzed, and then eliminated.
FastAcq® – Expedites debugging by clearly showing
imperfections
More than just color grading or event scanning, the FastAcq® proprietary
DPX® acquisition technology captures signals at more than
300,000 waveforms per second on all four channels simultaneously,
dramatically increasing the probability of discovering infrequent fault
events. And with a simple turn of the intensity knob you can clearly “see a
world others don't see”, displaying the complete picture of your circuit's
operation. Some oscilloscope vendors claim high waveform capture rates
for short bursts of time, but only MSO/DPO70000 Series oscilloscopes,
enabled by DPX® technology, can deliver these fast waveform capture
rates on a sustained basis.
Pinpoint® trigger
Whether you're trying to find a problem signal or need to isolate a section of
a complex signal for further analysis, like a DDR Read or Write burst,
Tektronix Pinpoint® triggering provides the solution. Pinpoint® triggering
allows selection of virtually all trigger types on both A and B trigger events
delivering the full suite of advanced trigger types for finding sequential
trigger events. Pinpoint® triggers provide trigger reset capabilities that
begin the trigger sequence again after a specified time, state, or transition
so that even events in the most complex signals can be captured. Other
oscilloscopes typically offer less than 20 trigger combinations; Pinpoint®
triggering offers over 1400 combinations, all at full performance. Visual
Trigger extends the Pinpoint Triggering's capabilities, adding another level
of trigger qualification to find important events in a wide variety of complex
signals.
With Enhanced Triggering, trigger jitter is reduced to <100 fs. With this
stability at the trigger point, the trigger point can be used as a measurement
reference.
B scan event trigger
Users who wish to create eye diagrams from data bursts synchronized or
initiated by an A event will find the B Event Scan trigger function especially
useful. B Event Scan is an A to B trigger sequence that will trigger and
capture burst event data of interest defined by the B Event setup menu.
Captured bits can be scanned in a sequential or randomized fashion,
alternatively the trigger can toggle between two successive B trigger
events.
B Event Scan identifies specific events to build an eye diagram.
Datasheet
14 www.tek.com



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