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ATO25F1GC-30EC Datasheet(PDF) 41 Page - List of Unclassifed Manufacturers

Part # ATO25F1GC-30EC
Description  3.3V 1G-BIT Serial NAND Flash Memory with Quad SPI
PDF  46 Pages
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Manufacturer  ETC [List of Unclassifed Manufacturers]
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ATO25F1GC-30EC Datasheet(HTML) 41 Page - List of Unclassifed Manufacturers

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Sep.2013. Rev 0.5
1Gbit Serial NAND Flash Memory
Table 14.
AC characteristics (104 MHz operation)
Test conditions specified in Table9 and Table11
Symbol
Alt.
Parameter
Min.
Typ.
(1)
Max.
Unit
fQ
fQ
Clock frequency for the following instructions:
Read, Page Program, Block Erase, WREN,
WRDI, RDID, Get Feature, Set Feature
D.C.
104
MHz
tRD
tR
Page Read time (cell array to page buffer)
25
us
tCH
(2)
tCLH
Clock High time
4.5
ns
tCL
(2)
tCLL
Clock Low time
4.5
ns
tCLCH
(3)
Clock Rise time
(4)
(peak to peak)
0.1
V/ns
tCHCL
(3)
Clock Fall time
(3)
(peak to peak)
0.1
V/ns
tSLCH
tCSS
CS# active setup time (relative to C)
5
ns
tCHSL
CS# not active hold time (relative to C)
7
ns
tDVCH
tDSU
Data In setup time
3
ns
tCHDX
tDH
Data In hold time
5
ns
tCHSH
CS# active hold time (relative to C)
5
ns
tSHCH
CS# not active setup time (relative to C)
5
ns
tSHSL
tCSH
CS# deselect time
30
ns
tSHQZ
(3)
tDIS
Output disable time
8
ns
tCLQV
tV
Clock Low to Output Valid(30pF)
8
ns
tCLQV2
tV2
Clock Low to Output Valid(15pF)
6
ns
tCLQX
tHO
Output hold time
0
ns
tHLCH
HOLD setup time (relative to C)
5
ns
tCHHH
HOLD hold time (relative to C)
5
ns
tHHCH
HOLD setup time (relative to C)
5
ns
tCHHL
HOLD hold time (relative to C)
5
ns
tHHQX
(3)
tLZ
HOLD to Output Low-Z
8
ns
tHLQZ
(3)
tHZ
HOLD to Output High-Z
8
ns
tWHSL
(5)
Write Protect setup time
20
ns
tSHWL
(5)
Write Protect hold time
100
ns
tDP
(3)
CS# High to Deep Power-down mode
10
µs
tPP
Page Program time
200
500
us
tBE
Block Erase time
2
3
ms
tRST
After Reset, Recovery time for RD/PGM/Erase
Max 5us/10us/500us
µs
NOP
Number of partial programming operation
supported.
Main
4
Spare
4
1
Typical values given for TA = 25°C.
2
tCH + tCL must be greater than or equal to 1/ fC
3
Value guaranteed by characterization, not 100% tested in production.
4
Expressed as a slew-rate.



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