MSP430F14X datasheet(31/83 Pages) TI

31 / 83 page

MSP430F149, MSP430F148, MSP430F147

MSP430F1491, MSP430F1481, MSP430F1471

MSP430F135, MSP430F133

www.ti.com

SLAS272H – JULY 2000 – REVISED MAY 2018

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Product Folder Links: MSP430F149 MSP430F148 MSP430F147 MSP430F1491 MSP430F1481 MSP430F1471

MSP430F135 MSP430F133

Specifications

(1)

The sensor current ISENSOR is consumed if (ADC12ON = 1 and REFON = 1), or (ADC12ON = 1 AND INCH = 0Ah and sample signal is

high). Therefore, it includes the constant current through the sensor and the reference.

(2)

Not production tested, limits characterized

(3)

The typical equivalent impedance of the sensor is 51 k

Ω. The sample time required includes the sensor on-time, tSENSOR(on).

(4)

No additional current is needed. The VMID is used during sampling.

(5)

N/A = Not applicable

(6)

The on-time tVMID(on) is included in the sampling time tVMID(sample); no additional on time is needed.

5.28 12-Bit ADC, Temperature Sensor and Built-In VMID

over recommended operating supply voltage and free-air temperature (unless otherwise noted)

PARAMETER

TEST CONDITIONS

VCC

MIN

TYP

MAX

UNIT

ISENSOR

Operating supply current into

AVCC terminal

(1)

REFON = 0, INCH = 0Ah,

ADC12ON = N/A, TA = 25°C

2.2 V

120

µA

3 V

160

VSENSOR

Sensor output voltage(2)

ADC12ON = 1, INCH = 0Ah,

TA = 0°C

2.2 V

986

986 ±5%

3 V

986

986 ±5%

TCSENSOR

Temperature coefficient of

sensor output voltage(2)

ADC12ON = 1, INCH = 0Ah

2.2 V

3.55

3.55 ±3%

mV/°C

3 V

3.55

3.55 ±3%

tSENSOR(sample)

Sample time required if

channel 10 is selected(2)(3)

ADC12ON = 1, INCH = 0Ah,

Error of conversion result

≤ 1 LSB

2.2 V

µs

3 V

IVMID

Current into divider at

channel 11 (4)

ADC12ON = 1, INCH = 0Bh

2.2 V

N/A(5)

µA

3 V

N/A

VMID

AVCC divider at channel 11

ADC12ON = 1, INCH = 0Bh,

VMID ≈ 0.5 × VAVCC

2.2 V

1.1

1.1 ±0.04

3 V

1.5

1.5 ±0.04

tVMID(sample)

Sample time required if

channel 11 is selected(6)

ADC12ON = 1, INCH = 0Bh,

Error of conversion result

≤ 1 LSB

2.2 V

1400

3 V

1220

(1)

The cumulative program time must not be exceeded when writing to a 64-byte flash block. This parameter applies to all programming

methods: individual word or byte write and block write modes.

(2)

The mass erase duration generated by the flash timing generator is at least 11.1 ms ( = 5297 × 1/fFTG, maximum = 5297 × 1/476 kHz).

To achieve the required cumulative mass erase time the flash controller mass erase operation can be repeated until this time is met. A

worst case minimum of 19 cycles are required.

(3)

These values are hardwired into the flash controller state machine (tFTG = 1/fFTG).

5.29 Flash Memory

over recommended operating supply voltage and free-air temperature (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

VCC(PGM/ERASE)

Program and erase supply voltage

2.7

3.6

fFTG

Flash timing generator frequency

257

476

kHz

IPGM

Supply current from DVCC during program

VCC = 2.7 V or 3.6 V

IERASE

Supply current from DVCC during erase

VCC = 2.7 V or 3.6 V

tCPT

Cumulative program time(1)

VCC = 2.7 V or 3.6 V

tCMErase

Cumulative mass erase time(2)

VCC = 2.7 V or 3.6 V

200

Program and erase endurance(3)

104

105

cycles

tRetention

Data retention duration(3)

TJ = 25°C

100

years

tWord

Word or byte program time(3)

tFTG

tBlock, 0

Block program time for first byte or word(3)

tFTG

tBlock, 1-63

Block program time for each additional byte or word(3)

tFTG

tBlock, End

Block program end-sequence wait time(3)

tFTG

tMass Erase

Mass erase time(3)

5297

tFTG

tSeg Erase

Segment erase time(3)

4819

tFTG

MSP430F14X Datasheet(PDF) 31 Page - Texas Instruments

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