| Electronic Components Datasheet Search |
|
DSP56374UM/D Datasheet(PDF) 51 Page - Freescale Semiconductor, Inc |
|
|
|||||||||||||||||||||||||||||
DSP56374UM/D Datasheet(HTML) 51 Page - Freescale Semiconductor, Inc |
|
51 / 64 page ![]() JTAG Timing DSP56374 Data Sheet, Rev. 4.2 Freescale Semiconductor 51 Figure 18. Test Clock Input Timing Diagram 109 TCK cycle time in Crystal mode 100.0 — ns 110 TCK clock pulse width measured at 1.65 V 50.0 — ns 111 TCK rise and fall times — 3.0 ns 112 Boundary scan input data setup time 15.0 — ns 113 Boundary scan input data hold time 24.0 — ns 114 TCK low to output data valid — 40.0 ns 115 TCK low to output high impedance — 40.0 ns 116 TMS, TDI data setup time 5.0 — ns 117 TMS, TDI data hold time 25.0 — ns 118 TCK low to TDO data valid — 44.0 ns 119 TCK low to TDO high impedance — 44.0 ns Note: 1. VCORE_VDD = 1.25 V ± 0.05 V; TJ = -40°C to 110°C (52 LQFP) / -40°C to 105°C (80 LQFP), CL = 50 pF 2. All timings apply to OnCE module data transfers because it uses the JTAG port as an interface. Table 27. JTAG Timing (continued) No. Characteristics All frequencies Unit Min Max TCK (Input) VM VM VIH VIL 109 110 110 111 111 |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |