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MPF5023AMBA0ES Datasheet(PDF) 8 Page - NXP Semiconductors

Part # MPF5023AMBA0ES
Description  Power management integrated circuit (PMIC) for high performance applications
PDF  91 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

MPF5023AMBA0ES Datasheet(HTML) 8 Page - NXP Semiconductors

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NXP Semiconductors
PF5023
Power management integrated circuit (PMIC) for high performance applications
PF5023
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2020. All rights reserved.
Product data sheet
Rev. 1 — 15 April 2020
8 / 91
Table 8. Voltage supply summary
Regulator
Type
Input supply
Regulated output
range (V)
VOUT
programmable step
(mV)
IRATED (mA)
SW1
Buck
SW1IN
0.4 V to 1.8 V
6.25
2500
SW2
Buck
SW2IN
VTT/0.4 V to 1.8 V
6.25
2500
SW3
Buck
SW3IN
0.4 V to 1.8 V
6.25
2500
12.4 Device differences
Table 9. Device differences
Description
PF5023 non-safety PF5023 ASIL B
Bits not available on PF5023 non-
safety
During the self-test, the device checks:
• The high speed oscillator circuit is operating within
a maximum of 15 % tolerance
• A CRC is performed on the mirror registers during
the self-test routine to ensure the integrity of the
registers before powering up
• The output of both the voltage generation bandgap
and the monitoring bandgap are not more than 5 %
to 12 % apart from each other
• ABIST test on all voltage monitors and toggling
signals
Not available
Available
AB_SWx_OV
AB_SWx_UV
STEST_NOK
AB_RUN
Fail-safe state: to lock down the system in case of
critical failures cycling the PMIC ON/OFF.
Not available
Available
FS_CNT[3:0]
OTP_FS_BYPASS
OTP_FS_MAX_CNT[3:0]
OTP_FS_OK_TIMER[2:0]
Secure I2C write: I2C write procedure to modify
registers dedicated to safety features (I2C CRC is still
available).
Not available
Available
I2C_SECURE_EN
OTP_I2C_SECURE _EN (always 0)
RANDOM_GEN[7:0]
RANDOM_CHK[7:0]



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