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ZAMC4100GA2R Datasheet(PDF) 141 Page - Renesas Technology Corp |
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ZAMC4100GA2R Datasheet(HTML) 141 Page - Renesas Technology Corp |
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141 / 156 page ![]() ZAMC4100 Datasheet © 2016 Integrated Device Technology, Inc. 141 January 26, 2016 5.1.3. Over-Temperature (OVT) Protection Event The internal chip temperature exceeds the maximum specified junction temperature for the system (see Table 1.2). Detection Continuous comparison between the internal reference and the internal temperature sensor’s voltage. Capturing The event is captured in the SBC, and an interrupt is propagated to the MCU. Reaction All drivers are automatically disabled. 5.1.4. Over-Voltage (OV) Detection Event The voltage at the VDDE pin is higher than the upper supply range limit specified in Table 1.5. Detection Continuous comparison of the internal reference and VDDE pin voltage. Capturing The event is captured in the SBC, and an interrupt is propagated to the MCU. Reaction All drivers are automatically disabled. This feature can be turned off if not needed. 5.1.5. Under-Voltage (UV) Detection Event The voltage at the VDDE pin is higher than the lower supply range limit specified in Table 1.5. Detection Continuous comparison of the internal reference and VDDE pin voltage. Capturing The event is captured in the SBC, and an interrupt is propagated to the MCU. Reaction All drivers are automatically disabled. This feature can be switched-off if not needed. 5.1.6. Short to GND or Vbat Protection of Sensor Supply Pin S_P and Analog Input Pins AIN1 and AIN2 Event The pin is shorted to the GND or Vbat rail (for the AIN1 and AIN2 pins through the external protection resistors; see the application diagram in Figure 6.1). Detection A Zener-like structure limits the voltage propagated through these pins to internal blocks. Capturing The event is not captured. Reaction Limit the voltage in order to protect the internal circuitry, or limit the current through the S_P pin in the event of a short to ground. 5.1.7. OSCL Output Clock Failure Detection Event There is a failure in the OSCL clock generation. The 125kHz clock is missing. Detection Internal circuitry running at the OSCH clock continuously observes the output of OSCL. If OSCL stops, a failure event is detected. Capturing The event is captured in the SBC, and an interrupt is propagated to the MCU. Reaction A response should be implemented in the MCU software depending on application requirements. |
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