MC68HC908GR4MP datasheet(268/286 Pages) FREESCALE

268 / 286 page

Electrical Specifications

MC68HC908GR8 • MC68HC908GR4 Data Sheet, Rev. 7

268

Freescale Semiconductor

23.15 Timer Interface Module Characteristics

23.16 Memory Characteristics

Characteristic

Symbol

Min

Max

Unit

Input capture pulse width

tTIH, tTIL

2—

tcyc

Timer input capture period

tTLTL

See Note(1)

1. The minimum period is the number of cycles it takes to execute the interrupt service routine plus 1 tcyc.

—

tcyc

Characteristic

Symbol

Min

Typ

Max

Unit

RAM data retention voltage

VRDR

1.3

—

FLASH program bus clock frequency

—

MHz

FLASH read bus clock frequency

fRead

(1)

1. fRead is defined as the frequency range for which the FLASH memory can be read.

32k

—

8.4M

FLASH page erase time

Limited endurance (<1 K cycles)

Maximum endurance (> 1 K cycles)

tErase

0.9

3.6

1.1

5.5

FLASH mass erase time

tMErase

4—

—

FLASH PGM/ERASE to HVEN set up time

tnvs

—

μs

FLASH high-voltage hold time

tnvh

5—

—

μs

FLASH high-voltage hold time (mass erase)

tnvhl

100

—

μs

FLASH program hold time

tpgs

5—

—

μs

FLASH program time

tPROG

—

μs

FLASH return to read time

trcv

(2)

2. trcv is defined as the time it needs before the FLASH can be read after turning off the high voltage charge pump, by clearing

HVEN to 0.

1—

—

μs

FLASH cumulative program HV period

tHV

(3)

3. tHV is defined as the cumulative high voltage programming time to the same row before next erase.

tHV must satisfy this condition: tnvs + tnvh + tpgs + (tPROG × 64) ≤ tHV max.

——

FLASH endurance(4)

4. Typical endurance was evaluated for this product family. For additional information on how Freescale defines typical

Endurance, please refer to Engineering Bulletin EB619.

—

10k

100k

—

Cycles

FLASH data retention time(5)

5. Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated

to 25°C using the Arrhenius equation. For additional information on how Freescale defines Typical Data Retention, please

refer to Engineering Bulletin EB618.

—

100

—

Years

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