R5F526TACDFM datasheet(120/142 Pages) RENESAS

120 / 142 page

R01DS0407EJ0120 Rev.1.20

Page 120 of 142

Oct 31, 2024

RX26T Group

2. Electrical Characteristics

2.5

A/D Conversion Characteristics

Note 1. When PCLKD was higher than 40 MHz, 1000 pF capacitors were placed in parallel with the 0.1-µF capacitors between AVCC0 and

AVSS0, AVCC1 and AVSS1, and AVCC2 and AVSS2 for measurement of the A/D conversion characteristics.

Note 2. The conversion time is the sum of the sampling time and the comparison time. The numbers of sampling-clock cycles are

indicated as the test conditions.

Table 2.44

12-Bit A/D (Unit 0, 1, 2) Conversion Characteristics (1)

Conditions: VCC = 2.7 to 5.5 V, 4.5 V ≤ AVCC0 = AVCC1 = AVCC2 ≤ 5.5 V,

VSS = AVSS0 = AVSS1 = AVSS2 = 0 V, Ta = Topr, PCLKB = PCLKD = 8 to 60 MHz*1,

Source impedance = 1.0 kΩ

Item

Min.

Typ.

Max.

Unit

Test Conditions

Resolution

Bit

Analog input capacitance

—

Conversion time*2

(Operation at

PCLKD = 60 MHz)

AN000 to AN002,

AN100 to AN102

Channel-dedicated

sample-and-hold

circuits in use

Constant

sampling

enabled

1.00

—

µs

 Sampling time: 24 PCLKD

Constant

sampling

disabled

1.40

—

 Sampling time of channel-dedicated

sample-and-hold circuits: 24 PCLKD

 Sampling time: 24 PCLKD

Channel-dedicated sample-and-

hold circuits not in use

0.90

—

 Sampling time: 30 PCLKD

AN003, AN103

0.90

—

 Sampling time: 30 PCLKD

AN200 to AN211

0.95

—

 Sampling time: 33 PCLKD

AN216 to AN217

1.05

—

 Sampling time: 39 PCLKD

Offset error

Channel-dedicated sample-and-

hold circuits in use

—

±1.5

±6.0

LSB

AN000 to AN002, AN100 to AN102 =

0.2 V

Channel-dedicated sample-and-

hold circuits not in use

—

±1.5

±5.0

Full-scale error

Channel-dedicated sample-and-

hold circuits in use

—

±1.5

±5.5

LSB

AN000 to AN002 = AVCC0 – 0.2 V

AN100 to AN102 = AVCC1 – 0.2 V

Channel-dedicated sample-and-

hold circuits not in use

—

±1.5

±4.5

Quantization error

Channel-dedicated sample-and-

hold circuits in use

—

±0.5

—

LSB

Channel-dedicated sample-and-

hold circuits not in use

—±0.5

—

Absolute accuracy

AN000 to AN002,

AN100 to AN102

Channel-dedicated sample-and-

hold circuits in use

—

±3.0

±6.0

LSB

Channel-dedicated sample-and-

hold circuits not in use

—

±2.5

±5.5

AN003, AN103

—

±2.5

±5.5

AN200 to AN211

—

±2.5

±5.5

AN216 to AN217

—

±2.5

±6.5

DNL differential nonlinearity error

Channel-dedicated sample-and-

hold circuits in use

—

±1.0

±2.5

LSB

Channel-dedicated sample-and-

hold circuits not in use

—

±1.0

±1.5

INL integral nonlinearity error

Channel-dedicated sample-and-

hold circuits in use

—

±1.5

±4.0

LSB

Channel-dedicated sample-and-

hold circuits not in use

—

±1.5

±2.5

Holding time of the channel-dedicated sample-and-hold circuit

—

µs

Dynamic range

AN000 to AN002

Channel-dedicated sample-and-

hold circuits in use

0.2

—

AVCC0

– 0.2

AN100 to AN102

Channel-dedicated sample-and-

hold circuits in use

0.2

—

AVCC1

– 0.2

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