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MM908E624ACEW/R2 Datasheet(PDF) 36 Page - Freescale Semiconductor, Inc |
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MM908E624ACEW/R2 Datasheet(HTML) 36 Page - Freescale Semiconductor, Inc |
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36 / 40 page ![]() Analog Integrated Circuit Device Data 36 Freescale Semiconductor 908E624 ADDITIONAL DOCUMENTATION THERMAL ADDENDUM (REV 3.0) ADDITIONAL DOCUMENTATION THERMAL ADDENDUM (REV 3.0) INTRODUCTION This thermal addendum is provided as a supplement to the MM908E624 technical datasheet. The addendum provides thermal performance information that may be critical in the design and development of system applications. All electrical, application, and packaging information is provided in the datasheet. Packaging and Thermal Considerations The MM908E624 is a dual die package. There are two heat sources in the package independently heating with P1 and P2. This results in two junction temperatures, TJ1 and TJ2, and a thermal resistance matrix with RθJAmn. For m, n = 1, RθJA11 is the thermal resistance from Junction 1 to the reference temperature while only heat source 1 is heating with P1. For m = 1, n = 2, RθJA12 is the thermal resistance from Junction 1 to the reference temperature while heat source 2 is heating with P2. This applies to RθJ21 and RθJ22, respectively. The stated values are solely for a thermal performance comparison of one package to another in a standardized environment. This methodology is not meant to and will not predict the performance of a package in an application-specific environment. Stated values were obtained by measurement and simulation according to the standards listed below Standards 54-TERMINAL SOICW 908E624 DWB SUFFIX EW (Pb-FREE) SUFFIX 98ASA99294D 54-TERMINAL SOICW Note For package dimensions, refer to the MM908E624 datasheet. TJ1 TJ2 = RθJA11 RθJA21 RθJA12 RθJA22 . P1 P2 Table 16. Thermal Performance Comparison Thermal Resistance 1 = Power Chip, 2 = Logic Chip [ °C/W] m = 1, n = 1 m = 1, n = 2 m = 2, n = 1 m = 2, n = 2 RθJAmn (1)(2) 40 31 36 RθJBmn (2)(3) 25 16 21 RθJAmn (1)(4) 57 47 52 RθJCmn (5) 21 12 16 Notes: 1. Per JEDEC JESD51-2 at natural convection, still air condition. 2. 2s2p thermal test board per JEDEC JESD51-7and JESD51-5. 3. Per JEDEC JESD51-8, with the board temperature on the center trace near the power outputs. 4. Single layer thermal test board per JEDEC JESD51-3 and JESD51-5. 5. Thermal resistance between the die junction and the exposed pad, “infinite” heat sink attached to exposed pad. 54 Terminal SOIC 0.65 mm Pitch 17.9 mm x 7.5 mm Body |
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