ADIS16505-2SLASHPCBZ datasheet(35/41 Pages) AD

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Data Sheet

ADIS16505

Rev. C | Page 35 of 41

Global Commands (GLOB_CMD)

Table 111. GLOB_CMD Register Definition

Addresses

Default

Access

Flash Backup

0x68, 0x69

Not applicable

Table 112. GLOB_CMD Bit Definitions

Bits

Description

[15:8]

Not used

Software reset

[6:5]

Not used

Flash memory test

Flash memory update

Sensor self test

Factory calibration restore

Not used

The GLOB_CMD register (see Table 111 and Table 112) provides

trigger bits for several operations. Write a 1 to the appropriate

bit in GLOB_CMD to start a particular function. During the

execution of these commands, data production stops, pulsing stops

on the DR pin, and the SPI interface does not respond to requests.

Table 1 provides the execution time for each GLOB_CMD

command.

Software Reset

Use the following DIN sequence to set Register GLOB_CMD,

Bit 7 = 1, which triggers a reset: 0xE880, then 0xE900. This reset

clears all data, and then restarts data sampling and processing.

This function provides a firmware alternative to toggling the

RST pin (see Table 5, Pin F3).

Flash Memory Test

Use the following DIN sequence to set Register GLOB_CMD,

Bit 4 = 1, which tests the flash memory: 0xE810, then 0xE900.

The command performs a CRC computation on the flash memory

(excluding user register locations) and compares it to the original

CRC value, which comes from the factory configuration process.

If the current CRC value does not match the original CRC

value, Register DIAG_STAT, Bit 6 (see Table 11), rises to 1,

indicating a failing result.

Flash Memory Update

Use the following DIN sequence to set Register GLOB_CMD,

Bit 3 = 1, which triggers a backup of all user configurable registers

in the flash memory: 0xE808, then 0xE900. Register DIAG_STAT,

Bit 2 (see Table 11), identifies success (0) or failure (1) in

completing this process.

Sensor Self Test

Use the following DIN sequence to set Register GLOB_CMD,

Bit 2 = 1, which triggers the self test routine for the inertial sensors:

0xE804, then 0xE900. The self test routine uses the following

steps to validate the integrity of each inertial sensor:

1. Measure the output on each sensor.

2. Activate an internal stimulus on the mechanical elements of

each sensor to move them in a predicable manner and

create an observable response in the sensors.

3. Measure the output response on each sensor.

4. Deactivate the internal stimulus on each sensor.

5. Calculate the difference between the sensor measurements

from Step 1 (stimulus is off) and from Step 4 (stimulus is on).

6. Compare the difference with internal pass and fail criteria.

7. Report the pass and fail result to Register DIAG_STAT, Bit 5

(see Table 11).

Motion during the execution of this test can indicate a false failure.

Factory Calibration Restore

Use the following DIN sequence to set Register GLOB_CMD,

Bit 1 = 1, to restore the factory default settings for the MSC_

CTRL, DEC_RATE, and FILT_CTRL registers and to clear all

user configurable bias correction settings: 0xE802, then 0xE900.

Executing this command results in writing 0x0000 to the following

registers: XG_BIAS_LOW, XG_BIAS_HIGH, YG_BIAS_LOW,

YG_BIAS_HIGH, ZG_BIAS_LOW, ZG_BIAS_ HIGH,

XA_BIAS_LOW, XA_BIAS_HIGH, YA_BIAS_LOW,

YA_BIAS_HIGH, ZA_BIAS_LOW, and ZA_BIAS_HIGH.

ADIS16505-2/PCBZ Datasheet(PDF) 35 Page - Analog Devices

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