ATXMEGA8E5_14 datasheet(51/147 Pages) ATMEL

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XMEGA E5 [DATASHEET]

Atmel-8153I–AVR-ATxmega8E5-ATxmega16E5-ATxmega32E5_Datasheet–08/2014

28.

ADC – 12-bit Analog to Digital Converter

28.1

Features

12-bit resolution

Up to 300 thousand samples per second

Down to 2.3μs conversion time with 8-bit resolution

Down to 3.35μs conversion time with 12-bit resolution

Differential and single-ended input

Up to 16 single-ended inputs

16x8 differential inputs with optional gain

Built-in differential gain stage

1/2x, 1x, 2x, 4x, 8x, 16x, 32x, and 64x gain options

Single, continuous and scan conversion options

Four internal inputs

Internal temperature sensor

DAC output

AVCC voltage divided by 10

1.1V bandgap voltage

Internal and external reference options

Compare function for accurate monitoring of user defined thresholds

Offset and gain correction

Averaging

Over-sampling and decimation

Optional event triggered conversion for accurate timing

Optional interrupt/event on compare result

Optional EDMA transfer of conversion results

28.2

Overview

The ADC converts analog signals to digital values. The ADC has 12-bit resolution and is capable of converting up to 300

thousand samples per second (ksps). The input selection is flexible, and both single-ended and differential

measurements can be done. For differential measurements, an optional gain stage is available to increase the dynamic

range. In addition, several internal signal inputs are available. The ADC can provide both signed and unsigned results.

The ADC measurements can either be started by application software or an incoming event from another peripheral in

the device. The ADC measurements can be started with predictable timing, and without software intervention. It is

possible to use EDMA to move ADC results directly to memory or peripherals when conversions are done.

Both internal and external reference voltages can be used. An integrated temperature sensor is available for use with the

ADC. The output from the DAC, AVCC/10 and the bandgap voltage can also be measured by the ADC.

The ADC has a compare function for accurate monitoring of user defined thresholds with minimum software intervention

required.

When operation in noisy conditions, the average feature can be enabled to increase the ADC resolution. Up to 1024

samples can be averaged, enabling up to 16-bit resolution results. In the same way, using the over-sampling and

decimation mode, the ADC resolution is increased up to 16-bits, which results in up to 4-bit extra LSB resolution. The

ADC includes various calibration options. In addition to standard production calibration, the user can enable the offset

and gain correction to improve the absolute ADC accuracy.

ATXMEGA8E5 Datasheet(PDF) 51 Page - ATMEL Corporation

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