12ASX2 datasheet(71/147 Pages) INFINEON

71 / 147 page

EiceDRIVER

™ SIL

1EDI2002AS

Protection and Diagnostics

Datasheet

Rev. 3.1, 2015-07-30

Hardware Description

Figure 3-7 Gate Monitoring Function: Timing Definition

The Gate Monitoring can be tested on system level by (for example) pulling the IGBT gate signal high while the

device issues a PWM Low command. This can be done for example in combination with the ASC function of

Infineon’s 1EBN100XAE “EiceDRIVER™ Boost” booster stage. It can then be verified that the reaction of the

device corresponds to the expected behavior.

3.4.3

Temperature Monitoring

The Temperature Monitoring functionality is summarized in Table 3-10:

The device is equipped with an internal temperature sensor. In case the value measured by the internal sensor

temperature exceeds a given threshold, bit PER.OTER is set.

3.4.4

SPI Error Detection

The SPI Error Detection mechanisms are summarized in Table 3-11:

Table 3-10 Temperature Monitoring Overview

Parameter

Short Description

Function

Warning in case of over-temperature.

Periodicity

Continuous.

Action in case of failure event

Flag PER.OTER is set.

Programmability

In-System Testability

Table 3-11 SPI Error Detection Overview

Parameter

Short Description

Function

Non valid SPI command detection and notification.

Periodicity

Continuous.

Action in case of failure event

Flag PER.SPIER is set.

VTOM2

time

VGATE1

VGATE2

VTOM1

VGATE

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