AMD-K6-2ESLASH233AMZ datasheet(143/332 Pages) AMD

143 / 332 page

Chapter 5

Signal Descriptions

125

22529B/0—January 2000

AMD-K6™-2E Processor Data Sheet

Preliminary Information

5.49

TMS (Test Mode Select)

Pin Attribute

Input, Internal Pullup

Pin Location

P-34

Summary

TMS specifies the test function and sequence of state changes

for boundary-scan testing using the Test Access Port (TAP). See

“Boundary-Scan Test Access Port (TAP)” on page 229 for details

regarding the operation of the TAP controller.

Sampled

The processor samples TMS on every rising TCK edge. If TMS is

sampled High for five or more consecutive clocks, the TAP

controller enters its Test-Logic-Reset state, regardless of the

controller state. This action is the same as that achieved by

asserting TRST#.

5.50

TRST# (Test Reset)

Pin Attribute

Input, Internal Pullup

Pin Location

Q-33

Summary

The assertion of TRST# initializes the Test Access Port (TAP) by

resetting its state machine to the Test-Logic-Reset state. See

“Boundary-Scan Test Access Port (TAP)” on page 229 for details

regarding the operation of the TAP controller.

Sampled

TRST# is a completely asynchronous input that does not

require a minimum setup and hold time relative to TCK. See

Ta bl e 64 on page 280 f o r the mini m u m pulse widt h

requirement.

AMD-K6-2E/233AMZ Datasheet(PDF) 143 Page - Advanced Micro Devices