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AMD-K6-2E/233AMZ Datasheet(PDF) 246 Page - Advanced Micro Devices

Part # AMD-K6-2E/233AMZ
Description  AMD-K6??2E Embedded Processor
PDF  332 Pages
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Manufacturer  AMD [Advanced Micro Devices]
Direct Link  http://www.amd.com
Logo AMD - Advanced Micro Devices

AMD-K6-2E/233AMZ Datasheet(HTML) 246 Page - Advanced Micro Devices

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228
Test and Debug
Chapter 12
AMD-K6™-2E Processor Data Sheet
22529B/0—January 2000
Preliminary Information
12.2
Three-State Test Mode
The three-state test mode causes the processor to float its
output and bidirectional pins, which is useful for board-level
manu fa c turing t e sting . I n t h is m o de, t he proc esso r is
electrically isolated from other components on a system board,
allowing automated test equipment (ATE) to test components
that drive the same signals as those the processor floats.
If the FLUSH# signal is sampled Low during the falling
transition of RESET, the processor enters the three-state test
mode. (See “FLUSH# (Cache Flush)” on page 104 for the
specific sampling requirements.) The signals floated in the
three-state test mode are as follows:
The VCC2DET, VCC2H/L#, and TDO signals are the only
outputs not floated in the three-state test mode.
s
VCC2DET and VCC2H/L# must remain Low to ensure the
system continues to supply the specified processor core
voltage to the VCC2 pins.
s
TDO is never floated because the boundary-scan Test Access
Port must remain enabled at all times, including during the
three-state test mode.
The three-state test mode is exited when the processor samples
RESET asserted.
s
A[31:3]
s
D/C#
s
M/IO#
s
ADS#
s
D[63:0]
s
PCD
s
ADSC#
s
DP[7:0]
s
PCHK#
s
AP
s
FERR#
s
PWT
s
APCHK#
s
HIT#
s
SCYC
s
BE[7:0]#
s
HITM#
s
SMIACT#
s
BREQ
s
HLDA
s
W/R#
s
CACHE#
s
LOCK#



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