| Electronic Components Datasheet Search |
|
ADIS16IMU5/PCBZ Datasheet(PDF) 3 Page - Analog Devices |
|
|
|||||||||||||||||||||||||||||
ADIS16IMU5/PCBZ Datasheet(HTML) 3 Page - Analog Devices |
|
3 / 46 page ![]() Data Sheet ADIS16575/ADIS16576/ADIS16577 SPECIFICATIONS analog.com Rev. 0 | 3 of 46 TC = 25°C, VDD = 3.3 V, angular rate = 0°/sec, and dynamic range = ±2000°/sec ± 1g, unless otherwise noted. Table 1. Specifications Parameter Test Conditions/Comments Min Typ Max Unit GYROSCOPES Dynamic Range ADIS16575-2, ADIS16576-2, ADIS16577-2 ±450 °/sec ADIS16576-3, ADIS16577-3 ±2000 °/sec ACCELEROMETERS Dynamic Range ADIS16575 ±8 g ADIS16576 ±14 g ADIS16577 ±40 g TEMPERATURE SENSOR Scale Factor Output = 0x0000 at 0°C (±5°C) 0.1 °C/LSB LOGIC INPUTS1 Input Voltage High, VIH 2.5 V Low, VIL 0.45 V Pulse Width 1 µs Input Current Logic 1, IIH VIH = 3.3 V 0.15 µA Logic 0, IIL VIL = 0 V All Pins Except RST 10 µA RST Pin 0.33 mA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS Output Voltage High, VOH Source current (ISOURCE) = 0.5 mA 2.65 V Low, VOL Sink current (ISINK) = 2.0 mA 0.4 V FLASH MEMORY Endurance2 100,000 Cycles Data Retention3 TJ = 85°C 20 Years FUNCTIONAL TIMES4 Time until data is available Power-On Start-Up Time 282 ms Reset Recovery Time Register GLOB_CMD, Bit 7 = 1 (see Table 128) 241 ms RST pulled low, then restored to high5 275 ms Factory Calibration Restore Register GLOB_CMD, Bit 1 = 1 (see Table 128) 48 ms Flash Memory Backup Register GLOB_CMD, Bit 3 = 1 (see Table 128) 48 ms Flash Memory Test Time Register GLOB_CMD, Bit 4 = 1 (see Table 128) 15 ms Self Test Time Register GLOB_CMD, Bit 2 = 1 (see Table 128) 19 ms CONVERSION RATE, fSM 4000 SPS Initial Clock Accuracy 3 % Synchronization Input Clock 1.9 6 4.1 kHz Scaled Input Clock 0.8 400 Hz POWER SUPPLY, VDD Operating voltage range 3.0 3.6 V Power Supply Current7 Normal mode, VDD = 3.3 V 30 mA 1 The digital input and output signals use a 3.3 V system. 2 Endurance is qualified as per JEDEC Standard 22, Method A117, measured at −40°C, +25°C, +85°C, and +125°C. 3 The data retention specification assumes a junction temperature (TJ) of 85°C per JEDEC Standard 22, Method A117. Data retention lifetime decreases with TJ. 4 These times do not include thermal settling and internal filter response times, which may affect overall accuracy. 5 The RST line must be in a low state for at least 10 µs to ensure a proper reset initiation and recovery. |
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |