LSM6DSV320X datasheet(14/212 Pages) STMICROELECTRONICS

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3. Measurements are performed in a uniform temperature setup and they are based on characterization data in a limited number of samples.

Not measured during final test for production.

4. Value after calibration.

5. Gyroscope rate noise density in high-performance mode is independent of the ODR and FS setting

6. Accelerometer noise density in high-performance mode is independent of the selected ODR and FS.

7. Accelerometer noise density in normal mode is independent of the ODR and FS setting.

8. Noise RMS related to BW = ODR/2.

9. This ODR is available when the accelerometer is in low-power mode.

10. Values specified by design.

11. The sign of the linear acceleration self-test output change is defined by the ST_XL_[1:0] bits in a dedicated register for all axes.

12. The linear acceleration self-test output change is defined with the device in stationary condition as the absolute value of: OUTPUT[LSb]

(self-test enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 0.061 mg at ±2 g full scale.

13. Accelerometer self-test limits are full-scale independent.

14. The sign of the angular rate self-test output change is defined by the ST_G_[1:0] bits in a dedicated register for all axes.

15. The angular rate self-test output change is defined with the device in stationary condition as the absolute value of: OUTPUT[LSb] (self-test

enabled) - OUTPUT[LSb] (self-test disabled). 1LSb = 70 mdps at ±4000 dps full scale.

LSM6DSV320X

Module specifications

DS14623 - Rev 1

page 14/212

LSM6DSV320X Datasheet(PDF) 14 Page - STMicroelectronics