MYX29GL01GS11DPIV2 datasheet(50/68 Pages) MICROSS

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MYX29GL01GS11DPIV2

Revision 1.0 - 01/26/2015

*Advanced information. Subject to change without notice.

1Gb GL-S MirrorBit® Eclipse™

Flash Memory

MYX29GL01GS11DPIV2*

Form #: CSI-D-685 Document 001

9 .5

Capacitance Characteristics

Table 19: Connector Capacitance for FBGA (LAE) Package

Parameter Symbol

Parameter Description

Test Setup

Typ

Max

Unit

CIN

Input Capacitance

VIN = 0

COUT

Output Capacitance

VOUT = 0

CIN2

Control Pin Capacitance

VIN = 0

RY/BY#

Output Capacitance

VOUT = 0

Notes:

1.Sampled,not100%tested.

2.TestconditionsTA=25°C,f=1.0MHz.

Timing Specifications

10 .1

AC Test Conditions

Figure 7: Test Setup

October 9, 2013 S29GL_128S_01GS_00_08

GL-S MirrorBit® Family

Data She e t

10. Timing Specifications

10.1 Key to Switching Waveforms

10.2 AC Test Conditions

Figure 10.1 Test Setup

Note:

1. Measured between VIL max and VIH min.

Figure 10.2 Input Waveforms and Measurement Levels

Waveform

Inputs

Outputs

Steady

Changing from H to L

Changing from L to H

Don't Care, Any Change Permitted

Changing, State Unknown

Does Not Apply

Center Line is High Impedance State (High-Z)

Table 10.1 Test Specification

Parameter

All Speeds

Units

Output Load Capacitance, CL

Input Rise and Fall Times (Note 1)

1.5

Input Pulse Levels

0.0-VIO

Input timing measurement reference levels

VIO/2

Output timing measurement reference levels

VIO/2

Device

Under

Test

VIO

0.0 V

0.5 VIO

Output

Measurement Level

Input

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