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S32K311NHT0MPAST Datasheet(PDF) 29 Page - NXP Semiconductors

Part # S32K311NHT0MPAST
Description  Automotive General Purpose MCUs
PDF  143 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

S32K311NHT0MPAST Datasheet(HTML) 29 Page - NXP Semiconductors

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Table 9. HSE firmware memory verification time examples (continued)
Symbol
Description
Min
Typ
Max
Unit
Condition
Spec
Number
application firmware,
using RSA 2048
cipher.
B). CORE_CLK = 120
MHz; HSE_CLK = 120
MHz.
tRSA_1024KB
Memory verification
of 1024 KB of
application firmware,
using RSA 2048
cipher.
23.8
ms
Device running from
PLL (clocking option
B). CORE_CLK = 120
MHz; HSE_CLK = 120
MHz.
tECDSA_64KB
Memory verification
of 64 KB of
application firmware,
using ECDSA 521
bits cipher.
TBC
ms
Device running from
PLL (clocking option
B). CORE_CLK = 120
MHz; HSE_CLK = 120
MHz.
tECDSA_1024KB
Memory verification
of 1024 KB of
application firmware,
using ECDSA 521
bits cipher.
TBC
ms
Device running from
PLL (clocking option
B). CORE_CLK = 120
MHz; HSE_CLK = 120
MHz.
tSHA2_256_64KB
Memory verification
of 64 KB of
application firmware,
using SHA2 256 bits
bits cipher.
0.64
ms
Device running from
PLL (clocking option
B). CORE_CLK = 120
MHz; HSE_CLK = 120
MHz.
tSHA2_256_
1024KB
Memory verification
of 1024 KB of
application firmware,
using SHA2 256 bits
bits cipher.
9.07
ms
Device running from
PLL (clocking option
B). CORE_CLK = 120
MHz; HSE_CLK = 120
MHz.
6.2 Supply Monitoring
Certain monitors are present on certain devices. See Power Management chapter in reference manual.
Table 10. Supply Monitoring
Symbol
Description
Min
Typ
Max
Unit
Condition
Spec
Number
LVD_V15
Low Voltage Detect
(LVD) on V15,
deassert threshold
(in FPM)
1.34
1.38
1.42
V
HVD_V15
High Voltage Detect
(HVD) on V15,
assert threshold (in
FPM) 1
2.5
V
Table continues on the next page...
NXP Semiconductors
Power management
S32K3xx Data Sheet, Rev. 9.1, 03/2024
Data Sheet: Technical Data
Preliminary Information for S32K388
29 / 143



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