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S32K311NHT0MPAST Datasheet(PDF) 53 Page - NXP Semiconductors |
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S32K311NHT0MPAST Datasheet(HTML) 53 Page - NXP Semiconductors |
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53 / 143 page ![]() Table 17. RUN mode supply currents (peripherals disabled) for S32K3x8, S32K34x, S32K32x and S32K314 (continued) S32K344, S32K324, S32K314 25, typ 7 51.3 54.8 69.6 62.7 75.1 97.5 NA NA 0.6 3.1 25, max 8 60.2 64.5 80.4 73.3 86.8 110 0.8 3.6 85, typ 7 64.5 68.1 83.1 76.2 89 111 0.6 3.2 85, max 8 104 108 124 117 131 155 0.8 3.9 105, typ 7 75.4 79 93.9 87.3 100 122.6 0.6 3.2 105, max 8 145 149 166 159 173 197 0.8 4.0 125, typ 7 97.4 101.2 116.4 110 122.9 145.7 0.6 3.3 125, max 8, 9 191 196 212 206 220 245 0.8 4.3 S32K342, S32K322, S32K341 25, typ 7 49.5 52.2 66.3 58.9 72.7 93.7 0.5 3.0 25, max 8 58.5 62.4 75.9 68.1 82.9 104.6 NA NA 0.8 3.6 85, typ 7 58.6 63.6 75.7 67.9 82.3 106.1 0.5 3.0 85, max 8 89.6 102.3 110.8 105.4 124.1 155 0.8 3.8 105, typ 7 68.3 76 85.6 80 92.3 119.3 0.5 3.1 105, max 8 124 143.4 157.5 150.5 164.5 191.6 0.8 4.0 125, typ 7 79.8 85.1 97.1 89.1 103.8 140.1 0.5 3.2 125, max 8, 9 146.7 164.7 178 171.3 188.7 235.6 0.8 4.2 1. Current numbers are for reduced configuration and may vary based on user configuration and silicon process variation. 2. See the configurations in Table 22. 3. RUN IDD @ V15 includes Flash memory read current from the V11 voltage rail. 4. For S32K388, the current from a V15 supply will flow through the external NMOS for the V11 regulation stage, and into the V11 pins of the device. 5. IO load current is not included. The actual current requirements for IOs will depend on the I/O configuration in the application. 6. RUN IDD @ VDD_HV_A includes Flash memory read current from the V25 voltage rail. 7. “typ” is indicative of the average current numbers at the nominal internally regulated V11 supply voltage, VDD_HV_A = 5.0V, VDD_HV_B = 5.0V, V15 = 1.5V, for the typical silicon process. 8. "max" is indicative of the maximum current numbers at the maximum internally regulated V11 supply voltage (1.16 V), VDD_HV_A = 5.5V, VDD_HV_B = 5.5V, V15= 1.65V, for the fast silicon process. 9. For the maximum allowable RUN current in an application, the junction temperature must be kept below the maximum specification, TJ < 150°C, to avoid self-heating. The data in this table is preliminary and based on first samples. NOTE Typical current numbers are indicative for typical silicon process and may vary based on the silicon distribution and user configuration. Typical conditions assumes VDD_HV_A = VREFH = 5 V, VDD_HV_B = 5V (if the VDD_HV_B domain present in the device), temperature = 25 °C and typical silicon process unless otherwise stated. NXP Semiconductors Power management S32K3xx Data Sheet, Rev. 9.1, 03/2024 Data Sheet: Technical Data Preliminary Information for S32K388 53 / 143 |
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