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S32K311NHT0MPAST Datasheet(PDF) 79 Page - NXP Semiconductors |
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S32K311NHT0MPAST Datasheet(HTML) 79 Page - NXP Semiconductors |
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79 / 143 page  Table 35. SAR_ADC (continued) Symbol Description Min Typ Max Unit Condition Spec Number RSW1 Channel selection Switch impedance 65.9 — 1410 Ohm all channels — RSW1 Channel selection Switch impedance 65.9 — 712 Ohm Precision channels — RSW1 Channel selection Switch impedance 65.9 — 1410 Ohm Standard channels — 1. Appropriate decoupling capacitors to be used to filter noise on the supplies. See application note AN5032 for reference supply design for SAR ADC. 2. VSS and VREFL should be shorted on PCB. 100mV difference between VSS and VREFL is for transient only (not for DC). 3. This is ADC Input range for ADC accuracy guaranteed in this input range only. For SoC Pin capability, see Operation Condition Section. 4. Spec valid if potential difference between VDD_HV_A and VREFH should follow VDD_HV_A +0.1V >=VREFH >= VDD_HV_A -1.5V 5. TUE spec for precision and standard channels is based on 12-bit level resolution. VA Source Filter Current Limiter EXTERNAL CIRCUIT RS Source Impedance RF Filter Resistance CF Filter Capacitance RL Current Limiter Resistance RSW1 Channel Selection Switch Impedance RAD Sampling Switch Impedance CP Pin Capacitance (two contributions: CP1, CP2) CS Sampling Capacitance INTERNAL CIRCUIT SCHEME CF CP1 CP2 CS RS RF RL RSW1 VDD_HV_A RAD Channel Selection Sampling Figure 35. SAR ADC Input Circuit 10.2 Supply Diagnosis The table below gives the specification for the on die supply diagnosis. Table 36. Supply Diagnosis Symbol Description Min Typ Max Unit Condition Spec Number AN_ACC Offset to internally monitored supply at ADC input 1,2,3 -5 0 5 % — — AN_T_on Switching time from closed (OFF) to conducting (ON) 1 — 2.5 12 ns — — AN_TADCSA Required ADC sampling time 2 1.2 — — µs — — NXP Semiconductors Analog modules S32K3xx Data Sheet, Rev. 9.1, 03/2024 Data Sheet: Technical Data Preliminary Information for S32K388 79 / 143 |
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