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S32K311NHT0MPAST Datasheet(PDF) 74 Page - NXP Semiconductors

Part # S32K311NHT0MPAST
Description  Automotive General Purpose MCUs
PDF  143 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

S32K311NHT0MPAST Datasheet(HTML) 74 Page - NXP Semiconductors

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Table 30. Flash memory Array Integrity and Margin Read specifications (continued)
Symbol
Characteristic
Min
Typical
Max1 2
Units3
tai512kseq
Array Integrity time and Margin
Read time for sequential sequence
on 512KB block.
—
—
16384 x Tperiod x Nread
(plus 40uS adder required if User
Margin Read)
—
tai1mseq
Array Integrity time and Margin
Read time for sequential sequence
on 1MB block.
—
—
32768 x Tperiod x Nread
(plus 40uS adder required if User
Margin Read)
—
tai2mseq
Array Integrity time and Margin
Read time for sequential sequence
on 2MB block.
—
—
65536 x Tperiod x Nread
(plus 40uS adder required if User
Margin Read)
—
tai256kprop
Array Integrity time for proprietary
sequence on 256KB block.
—
—
106496
x Tperiod x Nread
—
tai512kprop
Array Integrity time for proprietary
sequence on 512KB block.
—
—
229376
x Tperiod x Nread
—
tai1mprop
Array Integrity time for proprietary
sequence on 1MB block.
—
—
491520
x Tperiod x Nread
—
tai2mprop
Array Integrity time for proprietary
sequence on 2MB block.
—
—
1048576
x Tperiod x Nread
—
1. Array Integrity times need to be calculated and is dependent on system frequency and number of clocks per read. The
equation presented require Tperiod (which is the unit accurate period, thus for 200 MHz, Tperiod would equal 5e-9) and
Nread (which is the number of clocks required for read, including single read, dual read, quad read contribution. Thus for a
read setup that requires 6 clocks to read Nread would equal 6.
2. Array Integrity times are actual hardware execution times and do not include software overhead or system code execution
overhead.
3. The units for Array Integrity are determined by the period of the system clock. If unit accurate period is used in the
equation, the results of the equation are also unit accurate.
9.3 Flash memory module life specifications
Table 31. Flash memory module life specifications
Symbol
Characteristic
Conditions
Min
Typical
Units
Array P/E
cycles
Number of program/erase cycles per block
for 256 KB and 512 KB blocks using
Sector Erase.
—
100,000
—
P/E
cycles
Number of program/erase cycles per block for
1 MB and 2 MB blocks using Sector Erase.
—
1,000
—
P/E
cycles
Number of program/erase cycles per block
using Block Erase1
—
25
—
P/E
cycles
Table continues on the next page...
NXP Semiconductors
Flash memory specification
S32K3xx Data Sheet, Rev. 9.1, 03/2024
Data Sheet: Technical Data
Preliminary Information for S32K388
74 / 143



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