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S32K311NHT0MPAST Datasheet(PDF) 74 Page - NXP Semiconductors |
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S32K311NHT0MPAST Datasheet(HTML) 74 Page - NXP Semiconductors |
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74 / 143 page ![]() Table 30. Flash memory Array Integrity and Margin Read specifications (continued) Symbol Characteristic Min Typical Max1 2 Units3 tai512kseq Array Integrity time and Margin Read time for sequential sequence on 512KB block. — — 16384 x Tperiod x Nread (plus 40uS adder required if User Margin Read) — tai1mseq Array Integrity time and Margin Read time for sequential sequence on 1MB block. — — 32768 x Tperiod x Nread (plus 40uS adder required if User Margin Read) — tai2mseq Array Integrity time and Margin Read time for sequential sequence on 2MB block. — — 65536 x Tperiod x Nread (plus 40uS adder required if User Margin Read) — tai256kprop Array Integrity time for proprietary sequence on 256KB block. — — 106496 x Tperiod x Nread — tai512kprop Array Integrity time for proprietary sequence on 512KB block. — — 229376 x Tperiod x Nread — tai1mprop Array Integrity time for proprietary sequence on 1MB block. — — 491520 x Tperiod x Nread — tai2mprop Array Integrity time for proprietary sequence on 2MB block. — — 1048576 x Tperiod x Nread — 1. Array Integrity times need to be calculated and is dependent on system frequency and number of clocks per read. The equation presented require Tperiod (which is the unit accurate period, thus for 200 MHz, Tperiod would equal 5e-9) and Nread (which is the number of clocks required for read, including single read, dual read, quad read contribution. Thus for a read setup that requires 6 clocks to read Nread would equal 6. 2. Array Integrity times are actual hardware execution times and do not include software overhead or system code execution overhead. 3. The units for Array Integrity are determined by the period of the system clock. If unit accurate period is used in the equation, the results of the equation are also unit accurate. 9.3 Flash memory module life specifications Table 31. Flash memory module life specifications Symbol Characteristic Conditions Min Typical Units Array P/E cycles Number of program/erase cycles per block for 256 KB and 512 KB blocks using Sector Erase. — 100,000 — P/E cycles Number of program/erase cycles per block for 1 MB and 2 MB blocks using Sector Erase. — 1,000 — P/E cycles Number of program/erase cycles per block using Block Erase1 — 25 — P/E cycles Table continues on the next page... NXP Semiconductors Flash memory specification S32K3xx Data Sheet, Rev. 9.1, 03/2024 Data Sheet: Technical Data Preliminary Information for S32K388 74 / 143 |
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