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JS48F4400P0P3C0 Datasheet(PDF) 90 Page - Numonyx B.V |
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JS48F4400P0P3C0 Datasheet(HTML) 90 Page - Numonyx B.V |
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90 / 139 page ![]() Numonyx™ StrataFlash® Cellular Memory (M18) Datasheet April 2008 90 309823-10 Following the word count, subsequent bus-write cycles fill the write buffer with user- data up to the word count. Note: User-data is programmed into the flash array at the address issued when filling the write buffer. The Confirm command (00D0h) is issued after all user-data is written into the write buffer. The read mode of the device/addressed partition is automatically changed to Read Status Register mode. If other than the Confirm command is issued to the device, a command sequence error occurs and the operation aborts. After the Confirm command has been issued, the write-buffer contents are programmed into the flash memory array. The Status Register indicates a busy status (SR7 = 0) during array programming. During array programming, the only valid commands are Read Array, Read Device Information, CFI Query, Read Status, and Program Suspend. After array programming has completed (SR7 = 1), any valid command can be issued. Reading from another partition is allowed while data is being programmed into the flash memory array from the write buffer. Note: Issuing the Read Array, Read Device Information, or CFI Query command to a partition that is actively programming or erasing causes subsequent reads from that partition to output invalid data. Valid data is output only after the program or erase operation has finished. Upon completion of array programming, the Status Register indicates ready (SR7 = 1b). A full Status Register check should be performed to check for any programming errors. Then the Status Register should be cleared using the Clear Status Register command. A subsequent buffered programming operation can be initiated by repeating the buffered programming sequence. Any errors in the Status Register caused by the previous operation must be cleared to prevent them from masking any errors that may occur during the subsequent operation. 9.6.3 Buffered Enhanced Factory Programming (BEFP) Buffered Enhanced Factory Programming (BEFP) improves programming performance through the use of the write buffer, elevated programming voltage (VPPH), and enhanced programming algorithm. User-data is written into the write buffer, then the buffer contents are automatically written into the flash array in buffer-size increments. BEFP is allowed in both Control Mode and Object Mode. The programming mode selection for the entire flash array block is driven by the specific type of information, such as header or object data. Header/object data is aligned on a 1 KB programming region boundary in the main array block. Internal verification during programming (inherent to MLC technology) and Status Register error checking are used to determine proper completion of the programming operation. This eliminates delays incurred when switching between single-word program and verify operations. BEFP consists of three distinct phases: 1. Setup Phase: VPPH and block-lock checks 2. Program/Verify Phase: buffered programming and verification 3. Exit Phase: block-error check |
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