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MPF5024AMBA0ES Datasheet(PDF) 81 Page - NXP Semiconductors

Part # MPF5024AMBA0ES
Description  Power management integrated circuit (PMIC) for high performance applications
PDF  93 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

MPF5024AMBA0ES Datasheet(HTML) 81 Page - NXP Semiconductors

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NXP Semiconductors
PF5024
Power management integrated circuit (PMIC) for high performance applications
PF5024
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2020. All rights reserved.
Product data sheet
Rev. 1 — 15 April 2020
81 / 93
ADDR
Register Name
BIT7 BIT6 BIT5 BIT4 BIT3 BIT2 BIT1 BIT0 Configuration
D0
OTP DEBUG1
0
0
0
0
0
0
0
0
BG Monitor Disabled
D1
OTP SW COMP1
0
0
0
0
0
0
0
0
SW2 = 65GM | SW1 = 65GM
D2
OTP SW COMP2
0
0
0
0
0
0
0
0
SW4 = 65GM | SW3 = 65GM
18 Functional safety
18.1 System safety strategy
The PF5024 is defined in a context of safety and shall provide a set of features to
achieve the safety goals on such context. It provides a flexible yet complete safety
architecture to comply with ASIL B systems providing full programmability to enable
or disable features to address the safety goal. This architecture includes protective
mechanisms to avoid unwanted modification on the respective safety features, as
required by the system.
The following are features considered to be critical for the functional safety strategy:
• Internal watchdog timer
• External watchdog monitoring input (WDI)
• Output voltage monitoring with dedicated bandgap reference
• Protected I2C protocol with CRC verification
• Input overvoltage protection
• Analog built-in self-test (ABIST)
18.2 Output voltage monitoring with dedicated bandgap reference
For the type 1 buck regulators, the OV/UV monitor operate from the same reference
as the regulator. To ensure the integrity of the type 1 buck regulators, a comparison
between the regulator bandgap and the monitoring bandgap is performed. A 5 % to
12 % difference between the two bandgaps is an indicator of a potential regulation or
monitoring fault and is considered as a critical issue. Therefore, the device prevents the
switching regulators from powering up.
On the PF5024 ASIL B device, if a bandgap error is detected during a power up event,
the self-test will fail and prevent the device from powering up regardless of the value of
the OTP_BGMON_BYPASS bit.
During system On state, if a drift between two bandgaps is detected:
• When OTP_BGMON_BYPASS = 0, the power stage of the voltage regulators will be
shutdown.
• When OTP_BGMON_BYPASS = 1, The bandgap monitor only sends an interrupt to
the system to announce the bandgap failure.
The BGMON_I is asserted when a bandgap failure occurs, provided it is not masked.
The BGMON_S bit is set to 0 when the bandgaps are within range, and set to 1 when the
bandgaps are out of range.



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